Donge Zhao, Chaozheng Jia, Yayun Ma, Xuefeng Yang, Bin Zhang, W. Chu
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High-Accuracy Surface Profile Measurement Based on the Vortex Phase-Shifting Interferometry
According to the principle of phase-shifting interferometry and spiral phase characteristics of the vortex beam, this article proposes a method for detecting the surface profile of a transparent object, in which the +1 order vortex beam is generated by a spatial light modulator and is taken as the reference light. The influence of the nonlinear phase modulation characteristics of the spatial light modulator on the measurement precision is studied. The results show that nonlinear phase modulation has a great impact on the measurement. Then, the vortex lights with initial phases of 0, π/2, π, and 3π/2 are used to measure the H-type thin film sample based on the Twyman-Green interference system after correcting the nonlinear phase modulation characteristics. The experimental results show that the measurement error of the surface profile to an object with the theoretical value of 20 nm is 1.146 nm, and the feasibility of the optical vortex phase-shifting technique used to measure the surface profile of an object is verified.
期刊介绍:
International Journal of Optics publishes papers on the nature of light, its properties and behaviours, and its interaction with matter. The journal considers both fundamental and highly applied studies, especially those that promise technological solutions for the next generation of systems and devices. As well as original research, International Journal of Optics also publishes focused review articles that examine the state of the art, identify emerging trends, and suggest future directions for developing fields.