硅电极上的铜电沉积

IF 1 4区 工程技术 Q4 ENGINEERING, MECHANICAL
F. Lima, U. Mescheder, C. Müller, H. Reinecke
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引用次数: 3

摘要

本文报道了一种两步法在n型硅衬底上电化学沉积铜层的方法,该方法使用酸性硫酸铜溶液,无需添加添加剂和光辅助。在不同晶体取向的电极上生成金属层。该工艺由两种非常常见的技术组成:计时电流测定和脉冲电镀。前一种技术用于在工作电极上获得瞬时成核。因此,在脉冲技术开始之前,基底上形成了大量的金属核。然后,后者用于生长先前生成的颗粒,并在半导体电极上形成完全覆盖的均匀金属层。电位的大小是根据在半导体-电解质界面观察到的能级精心选择的,并在本工作中进行了计算。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Copper electrodeposition on silicon electrodes
A two-step process is reported for the electrochemical deposition of copper layers on n-type silicon substrates using an acidic copper sulphate solution without addition of additives and no light assistance. Metal layers were generated on electrodes with different crystal orientations. The process consists of a combination of two very common techniques: chronoamperometry and pulse plating. The former technique is applied to obtain an instantaneous nucleation on the working electrode. Therefore, a large amount of metal nuclei is formed on the substrate before the pulse technique starts. The latter is, then, used to grow the particles previously generated and form a homogeneous metal layer with full coverage onto the semiconductor electrodes. The potential magnitudes are carefully chosen in line with energy levels observed at the semiconductor-electrolyte interface and were also calculated in this work.
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来源期刊
CiteScore
1.60
自引率
25.00%
发文量
21
审稿时长
>12 weeks
期刊介绍: IJSurfSE publishes refereed quality papers in the broad field of surface science and engineering including tribology, but with a special emphasis on the research and development in friction, wear, coatings and surface modification processes such as surface treatment, cladding, machining, polishing and grinding, across multiple scales from nanoscopic to macroscopic dimensions. High-integrity and high-performance surfaces of components have become a central research area in the professional community whose aim is to develop highly reliable ultra-precision devices.
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