电击穿从宏观到微/纳米尺度:教程和审查的艺术状态

IF 1.3 Q3 ORTHOPEDICS
Yangyang Fu, Peng Zhang, J. Verboncoeur, Xinxin Wang
{"title":"电击穿从宏观到微/纳米尺度:教程和审查的艺术状态","authors":"Yangyang Fu, Peng Zhang, J. Verboncoeur, Xinxin Wang","doi":"10.1088/2516-1067/ab6c84","DOIUrl":null,"url":null,"abstract":"Fundamental processes for electric breakdown, i.e., electrode emission and bulk ionization, as well as the resultant Paschen’s law, are reviewed under various conditions. The effect of the ramping rate of applied voltage on breakdown is first introduced for macroscopic gaps, followed by showing the significant impact of the electric field nonuniformity due to gap geometry. The classical Paschen’s law assumes uniform electric field; a more general breakdown scaling law is illustrated for both DC and RF fields in geometrically similar gaps, based on the Townsend similarity theory. For a submillimeter gap, effects of electrode surface morphology with local field enhancement and electric shielding on the breakdown curve are discussed, including the most recent efforts. Breakdown characteristics and scaling laws in microgaps with both metallic and non-metallic (e.g., semiconductor) materials are detailed. For gap distance down to micro/nano scales, the breakdown characteristics and the breakdown mode transition from the secondary electron emission to the electric field emission or thermionic emission dominant regime. Additionally, the combined thermo-field emission regime is also reviewed. Previous efforts, including key simulations and experiments, have been devoted to diagnosing breakdown path evolution, measuring breakdown fields, and quantifying breakdown dependence on frequencies for gaps down to micro/nano scales. By summarizing and analyzing fundamental theories, recent progress, and on-going challenges, this tutorial review seeks to provide basic understanding and the state of the art of electric breakdown, which aids in advancing discoveries and promoting application prospects for discharge devices engineered in a wide range of regimes.","PeriodicalId":36295,"journal":{"name":"Plasma Research Express","volume":" ","pages":""},"PeriodicalIF":1.3000,"publicationDate":"2020-02-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1088/2516-1067/ab6c84","citationCount":"53","resultStr":"{\"title\":\"Electrical breakdown from macro to micro/nano scales: a tutorial and a review of the state of the art\",\"authors\":\"Yangyang Fu, Peng Zhang, J. Verboncoeur, Xinxin Wang\",\"doi\":\"10.1088/2516-1067/ab6c84\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Fundamental processes for electric breakdown, i.e., electrode emission and bulk ionization, as well as the resultant Paschen’s law, are reviewed under various conditions. The effect of the ramping rate of applied voltage on breakdown is first introduced for macroscopic gaps, followed by showing the significant impact of the electric field nonuniformity due to gap geometry. The classical Paschen’s law assumes uniform electric field; a more general breakdown scaling law is illustrated for both DC and RF fields in geometrically similar gaps, based on the Townsend similarity theory. For a submillimeter gap, effects of electrode surface morphology with local field enhancement and electric shielding on the breakdown curve are discussed, including the most recent efforts. Breakdown characteristics and scaling laws in microgaps with both metallic and non-metallic (e.g., semiconductor) materials are detailed. For gap distance down to micro/nano scales, the breakdown characteristics and the breakdown mode transition from the secondary electron emission to the electric field emission or thermionic emission dominant regime. Additionally, the combined thermo-field emission regime is also reviewed. Previous efforts, including key simulations and experiments, have been devoted to diagnosing breakdown path evolution, measuring breakdown fields, and quantifying breakdown dependence on frequencies for gaps down to micro/nano scales. By summarizing and analyzing fundamental theories, recent progress, and on-going challenges, this tutorial review seeks to provide basic understanding and the state of the art of electric breakdown, which aids in advancing discoveries and promoting application prospects for discharge devices engineered in a wide range of regimes.\",\"PeriodicalId\":36295,\"journal\":{\"name\":\"Plasma Research Express\",\"volume\":\" \",\"pages\":\"\"},\"PeriodicalIF\":1.3000,\"publicationDate\":\"2020-02-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1088/2516-1067/ab6c84\",\"citationCount\":\"53\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Plasma Research Express\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1088/2516-1067/ab6c84\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ORTHOPEDICS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Plasma Research Express","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1088/2516-1067/ab6c84","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ORTHOPEDICS","Score":null,"Total":0}
引用次数: 53

摘要

综述了在各种条件下电击穿的基本过程,即电极发射和体电离,以及由此产生的Paschen定律。首先针对宏观间隙介绍了施加电压的斜坡速率对击穿的影响,然后展示了由于间隙几何形状引起的电场不均匀性的显著影响。经典的Paschen定律假定电场是均匀的;基于Townsend相似性理论,对几何相似间隙中的DC和RF场说明了更一般的击穿比例律。对于亚毫米间隙,讨论了具有局部场增强和电屏蔽的电极表面形态对击穿曲线的影响,包括最近的工作。详细介绍了金属和非金属(如半导体)材料微电网的击穿特性和结垢规律。对于小到微米/纳米尺度的间隙距离,击穿特性和击穿模式从二次电子发射过渡到电场发射或热离子发射占主导地位。此外,还对组合热场发射机制进行了综述。以前的工作,包括关键的模拟和实验,都致力于诊断击穿路径的演变,测量击穿场,并量化击穿对频率的依赖性,以达到微米/纳米尺度。通过总结和分析基本理论、最新进展和正在进行的挑战,本教程综述旨在提供对击穿的基本理解和最新技术,这有助于推进在各种情况下设计的放电装置的发现和应用前景。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Electrical breakdown from macro to micro/nano scales: a tutorial and a review of the state of the art
Fundamental processes for electric breakdown, i.e., electrode emission and bulk ionization, as well as the resultant Paschen’s law, are reviewed under various conditions. The effect of the ramping rate of applied voltage on breakdown is first introduced for macroscopic gaps, followed by showing the significant impact of the electric field nonuniformity due to gap geometry. The classical Paschen’s law assumes uniform electric field; a more general breakdown scaling law is illustrated for both DC and RF fields in geometrically similar gaps, based on the Townsend similarity theory. For a submillimeter gap, effects of electrode surface morphology with local field enhancement and electric shielding on the breakdown curve are discussed, including the most recent efforts. Breakdown characteristics and scaling laws in microgaps with both metallic and non-metallic (e.g., semiconductor) materials are detailed. For gap distance down to micro/nano scales, the breakdown characteristics and the breakdown mode transition from the secondary electron emission to the electric field emission or thermionic emission dominant regime. Additionally, the combined thermo-field emission regime is also reviewed. Previous efforts, including key simulations and experiments, have been devoted to diagnosing breakdown path evolution, measuring breakdown fields, and quantifying breakdown dependence on frequencies for gaps down to micro/nano scales. By summarizing and analyzing fundamental theories, recent progress, and on-going challenges, this tutorial review seeks to provide basic understanding and the state of the art of electric breakdown, which aids in advancing discoveries and promoting application prospects for discharge devices engineered in a wide range of regimes.
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来源期刊
Plasma Research Express
Plasma Research Express Energy-Nuclear Energy and Engineering
CiteScore
2.60
自引率
0.00%
发文量
15
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