低维材料的原子和动态结构表征：原位透射电子显微镜的最新应用。

IF 1.5 4区工程技术 Q3 MICROSCOPY

Microscopy Pub Date : 2019-11-18 DOI:10.1093/jmicro/dfz038

He Zheng, Fan Cao, Ligong Zhao, Renhui Jiang, Peili Zhao, Ying Zhang, Yanjie Wei, S. Meng, Kaixuan Li, Shuangfeng Jia, Luying Li, Jianbo Wang

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引用次数: 2

摘要

原位透射电子显微镜在低维材料的原子尺度动力学分析方面取得了显著进展，并成为将材料的微观结构与其性能联系起来的不可或缺的工具。在这里，结合世界各地的一些前沿研究，我们简要回顾了我们在外部机械应力、热激励和电场作用下低维材料的动态原子表征方面的最新进展。还讨论了电子束在金属和金属氧化物中的辐照效应。最后，我们讨论了这一领域未来可能出现的事态发展。

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Atomistic and dynamic structural characterizations in low-dimensional materials: recent applications of in situ transmission electron microscopy.

In situ transmission electron microscopy has achieved remarkable advances for atomic-scale dynamic analysis in low-dimensional materials and become an indispensable tool in view of linking a material's microstructure to its properties and performance. Here, accompanied with some cutting-edge researches worldwide, we briefly review our recent progress in dynamic atomistic characterization of low-dimensional materials under external mechanical stress, thermal excitations and electrical field. The electron beam irradiation effects in metals and metal oxides are also discussed. We conclude by discussing the likely future developments in this area.

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来源期刊

Microscopy Physics and Astronomy-Instrumentation

CiteScore

3.30

自引率

11.10%

发文量

期刊介绍： Microscopy, previously Journal of Electron Microscopy, promotes research combined with any type of microscopy techniques, applied in life and material sciences. Microscopy is the official journal of the Japanese Society of Microscopy.