散射型液晶显示器液晶层厚度和折射率测量方法的发展

IF 0.5 Q4 PHYSICS, APPLIED

Latvian Journal of Physics and Technical Sciences Pub Date : 2022-08-01 DOI:10.2478/lpts-2022-0031

A. Ozols, G. Mozolevskis, R. Žalubovskis, M. Rutkis

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引用次数: 0

摘要

摘要提出了一种基于电容值的散射式显示液晶层厚度的测量方法，该方法适用于在线生产过程控制。选择该方法是因为它比光谱方法更有效和简单，因为传统的散射型显示方法不适用。在方法验证过程中，根据液晶层厚度测量数据，确定了一种新型扩散器液晶混合折射率。

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Development of Liquid Crystal Layer Thickness and Refractive Index Measurement Methods for Scattering Type Liquid Crystal Displays

Abstract We report the measuring method of scattering type display liquid crystal layer thickness based on capacitance values suitable for inline production process control. The method is selected for its effectiveness and simplicity over spectroscopic methods as conventional methods for scattering type displays are not applicable. During the method approbation process, a novel diffuser liquid crystal mixture refractive index was determined based on liquid crystal layer thickness measurement data.

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来源期刊

Latvian Journal of Physics and Technical Sciences PHYSICS, APPLIED-

CiteScore

1.50

自引率

16.70%

发文量

审稿时长

5 weeks

期刊介绍： Latvian Journal of Physics and Technical Sciences (Latvijas Fizikas un Tehnisko Zinātņu Žurnāls) publishes experimental and theoretical papers containing results not published previously and review articles. Its scope includes Energy and Power, Energy Engineering, Energy Policy and Economics, Physical Sciences, Physics and Applied Physics in Engineering, Astronomy and Spectroscopy.