用随机右截尾数据检验特定年龄分布下较好的失效率的一类检验

IF 0.7 Q2 MATHEMATICS

International Journal of Analysis and Applications Pub Date : 2023-08-04 DOI:10.28924/2291-8639-21-2023-80

G. R. Elkahlout

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引用次数: 0

摘要

当设备的故障率r(t)在t≤t0时增加，当设备的故障率r(t)在t0时不小于r(t)时的值时，设备的故障率较好，用BFR-t0表示。基于n个随机右截尾样本，提出了一种检验统计量来检验指数性与BFR-t0的关系。Kaplan-Meier估计用于估计经验寿命分布。测试的属性通过功率估计、估计风险和正态性测试来测量。通过对截尾样本数据的测试，研究了截尾导致的效率损失。

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A Class of Tests for Testing Better Failure Rate at Specific Age Distribution With Randomly Right Censored Data

A device has a better failure rate at specific age t0 property, denoted by BFR-t0 if its failure rate r(t) increases for t≤t0 and for t>t0, r(t) is not less than its value at t0. A test statistic is proposed to test exponentiality versus BFR-t0 based on a randomly right censored sample of size n. Kaplan-Meier estimator is used to estimate the empirical life distribution. Properties of the test are measured by power estimates, estimated risks, and test of normality. The efficiency loss due to censoring is investigated by using tests for censored sample data.

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来源期刊

International Journal of Analysis and Applications MATHEMATICS-

CiteScore

1.30

自引率

10.00%

发文量

审稿时长

12 weeks