基于SIMION的微通道板增益研究

建模与仿真(英文) Pub Date : 2019-12-13 DOI:10.4236/ojmsi.2020.81001

Yifan Zhao

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引用次数: 1

摘要

微通道板(MCP)广泛用于颗粒检测。chevron MCPs的增益与几何参数有关，但尚未通过SIMION仿真进行研究。本研究的目的是利用SIMION对一个v形MCP及其二次发射过程进行建模，并确定微通道板增益、电压、通道偏置角和直径之间的关系。两个几何文件模拟了MCP电场和形状，Lua程序模拟了二次发射。仿真结果表明，MCP增益与电压成正比，5 ~ 15度角之间增益最大，增益与直径成反比。本研究精确地模拟了一个v形MCP，并得出增益、电压、通道偏置角和直径之间的关系。需要进一步的研究来模拟电子轨迹以提高精度。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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The Study of Microchannel Plate Gain Using SIMION

Microchannel plates (MCP) are widely used for particle detection. The gain of chevron MCPs is related to geometrical parameters, but no study has been done through SIMION simulation. The purpose of this study is to model a chevron MCP and its secondary emission process using SIMION and determine the relationship between microchannel plate gain, voltage, channel bias angle, and diameter. Two geometry files simulated MCP electric field and shape, and a Lua program simulated secondary emission. Simulation results showed that MCP gain is proportional to voltage, angles between 5 and 15 degrees maximize gain, and gain is inversely proportional to the diameter. This study accurately simulates a chevron MCP and yields the relationship between gain, voltage, channel bias angle, and diameter. Further studies are needed to simulate electron trajectories for improved precision.

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建模与仿真(英文)

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