C2i 2019-第八届跨学科仪器学术研讨会

{"title":"C2i 2019-第八届跨学科仪器学术研讨会","authors":"A. Sommier, P. Picart, E. Vourc'h","doi":"10.18280/i2m.190300","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":38637,"journal":{"name":"Instrumentation Mesure Metrologie","volume":" ","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2020-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"C2i 2019 - 8th Interdisciplinary Instrumentation Colloquium\",\"authors\":\"A. Sommier, P. Picart, E. Vourc'h\",\"doi\":\"10.18280/i2m.190300\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":38637,\"journal\":{\"name\":\"Instrumentation Mesure Metrologie\",\"volume\":\" \",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Instrumentation Mesure Metrologie\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.18280/i2m.190300\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"Engineering\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Instrumentation Mesure Metrologie","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.18280/i2m.190300","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"Engineering","Score":null,"Total":0}