{"title":"基于Arduino的74系列集成电路门级测试系统","authors":"Y. Hashim, Marwa Awni, Abdullah Mufeed","doi":"10.11591/ijece.v13i5.pp4950-4957","DOIUrl":null,"url":null,"abstract":"The goal of this research article is to build and implement a low-cost, user-friendly 74-series logic integrated circuits (ICs) tester that is independent of a computer. Depending on the truth table of the gates and the IC configuration, the logic IC tester will be able to test the operation of the 74 series logic gates (AND, OR, NOR, NAND, XOR) of those ICs. It is feasible to test a range of logic ICs with higher pin widths thanks to the proposed system’s usage of an Arduino Mega platform module as a microcontroller, which provides the ability to connect 54 programmed logic inputs or outputs. The versatility offered by this design and the use of a personal computer allow for the reprograming and updating of the logic IC functional tester. Any 74-series ICs testing outcome will be shown on liquid crystal display (LCD) at the gate level. The logic IC functional tester was successfully constructed and operates flawlessly.","PeriodicalId":38060,"journal":{"name":"International Journal of Electrical and Computer Engineering","volume":" ","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2023-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Arduino based 74-series integrated circuits testing system at gate level\",\"authors\":\"Y. Hashim, Marwa Awni, Abdullah Mufeed\",\"doi\":\"10.11591/ijece.v13i5.pp4950-4957\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The goal of this research article is to build and implement a low-cost, user-friendly 74-series logic integrated circuits (ICs) tester that is independent of a computer. Depending on the truth table of the gates and the IC configuration, the logic IC tester will be able to test the operation of the 74 series logic gates (AND, OR, NOR, NAND, XOR) of those ICs. It is feasible to test a range of logic ICs with higher pin widths thanks to the proposed system’s usage of an Arduino Mega platform module as a microcontroller, which provides the ability to connect 54 programmed logic inputs or outputs. The versatility offered by this design and the use of a personal computer allow for the reprograming and updating of the logic IC functional tester. Any 74-series ICs testing outcome will be shown on liquid crystal display (LCD) at the gate level. The logic IC functional tester was successfully constructed and operates flawlessly.\",\"PeriodicalId\":38060,\"journal\":{\"name\":\"International Journal of Electrical and Computer Engineering\",\"volume\":\" \",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Journal of Electrical and Computer Engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.11591/ijece.v13i5.pp4950-4957\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"Computer Science\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Journal of Electrical and Computer Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.11591/ijece.v13i5.pp4950-4957","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"Computer Science","Score":null,"Total":0}
Arduino based 74-series integrated circuits testing system at gate level
The goal of this research article is to build and implement a low-cost, user-friendly 74-series logic integrated circuits (ICs) tester that is independent of a computer. Depending on the truth table of the gates and the IC configuration, the logic IC tester will be able to test the operation of the 74 series logic gates (AND, OR, NOR, NAND, XOR) of those ICs. It is feasible to test a range of logic ICs with higher pin widths thanks to the proposed system’s usage of an Arduino Mega platform module as a microcontroller, which provides the ability to connect 54 programmed logic inputs or outputs. The versatility offered by this design and the use of a personal computer allow for the reprograming and updating of the logic IC functional tester. Any 74-series ICs testing outcome will be shown on liquid crystal display (LCD) at the gate level. The logic IC functional tester was successfully constructed and operates flawlessly.
期刊介绍:
International Journal of Electrical and Computer Engineering (IJECE) is the official publication of the Institute of Advanced Engineering and Science (IAES). The journal is open to submission from scholars and experts in the wide areas of electrical, electronics, instrumentation, control, telecommunication and computer engineering from the global world. The journal publishes original papers in the field of electrical, computer and informatics engineering which covers, but not limited to, the following scope: -Electronics: Electronic Materials, Microelectronic System, Design and Implementation of Application Specific Integrated Circuits (ASIC), VLSI Design, System-on-a-Chip (SoC) and Electronic Instrumentation Using CAD Tools, digital signal & data Processing, , Biomedical Transducers and instrumentation, Medical Imaging Equipment and Techniques, Biomedical Imaging and Image Processing, Biomechanics and Rehabilitation Engineering, Biomaterials and Drug Delivery Systems; -Electrical: Electrical Engineering Materials, Electric Power Generation, Transmission and Distribution, Power Electronics, Power Quality, Power Economic, FACTS, Renewable Energy, Electric Traction, Electromagnetic Compatibility, High Voltage Insulation Technologies, High Voltage Apparatuses, Lightning Detection and Protection, Power System Analysis, SCADA, Electrical Measurements; -Telecommunication: Modulation and Signal Processing for Telecommunication, Information Theory and Coding, Antenna and Wave Propagation, Wireless and Mobile Communications, Radio Communication, Communication Electronics and Microwave, Radar Imaging, Distributed Platform, Communication Network and Systems, Telematics Services and Security Network; -Control[...] -Computer and Informatics[...]