分数阶MOS电容器:实验结果与蒙特卡罗分析

Q4 Engineering

Journal of Integrated Circuits and Systems Pub Date : 2023-05-22 DOI:10.29292/jics.v18i1.660

Lucas Almir dos Santos Fernandes, Marco Isaías Alayo Chávez, J. Martino

{"title":"分数阶MOS电容器:实验结果与蒙特卡罗分析","authors":"Lucas Almir dos Santos Fernandes, Marco Isaías Alayo Chávez, J. Martino","doi":"10.29292/jics.v18i1.660","DOIUrl":null,"url":null,"abstract":"In this work, an experimental implementation of a Fractional-order MOS capacitor using a fractal tree structure in discrete circuits was carried out in order to validate the theoretical results obtained of the simulations. In addition, a Monte Carlo analysis was performed to determine the sensitivity of the electrical circuit to the variation of some parameters.In these analyzes were observed that for a tolerance of 20% in the device values and for 2σ above and below the median values(for both, width, and initial frequency value of fractal zone) it is noticed a deviation of 18% and -14%, respectively, which is areasonable deviation for a group that contains more than 90% of the samples.","PeriodicalId":39974,"journal":{"name":"Journal of Integrated Circuits and Systems","volume":" ","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2023-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Fractional-Order MOS Capacitor: Experimental Results and Monte Carlo Analysis\",\"authors\":\"Lucas Almir dos Santos Fernandes, Marco Isaías Alayo Chávez, J. Martino\",\"doi\":\"10.29292/jics.v18i1.660\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this work, an experimental implementation of a Fractional-order MOS capacitor using a fractal tree structure in discrete circuits was carried out in order to validate the theoretical results obtained of the simulations. In addition, a Monte Carlo analysis was performed to determine the sensitivity of the electrical circuit to the variation of some parameters.In these analyzes were observed that for a tolerance of 20% in the device values and for 2σ above and below the median values(for both, width, and initial frequency value of fractal zone) it is noticed a deviation of 18% and -14%, respectively, which is areasonable deviation for a group that contains more than 90% of the samples.\",\"PeriodicalId\":39974,\"journal\":{\"name\":\"Journal of Integrated Circuits and Systems\",\"volume\":\" \",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-05-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Integrated Circuits and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.29292/jics.v18i1.660\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"Engineering\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Integrated Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.29292/jics.v18i1.660","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"Engineering","Score":null,"Total":0}

引用次数: 0

摘要

在这项工作中，为了验证模拟的理论结果，在离散电路中使用分形树结构对分数阶MOS电容器进行了实验实现。此外，还进行了蒙特卡罗分析，以确定电路对某些参数变化的敏感性。在这些分析中观察到，对于器件值的公差为20%，以及高于和低于中值的2σ（对于分形区的宽度和初始频率值），可以注意到偏差分别为18%和-14%，这对于包含90%以上样品的组来说是可接受的偏差。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Fractional-Order MOS Capacitor: Experimental Results and Monte Carlo Analysis

In this work, an experimental implementation of a Fractional-order MOS capacitor using a fractal tree structure in discrete circuits was carried out in order to validate the theoretical results obtained of the simulations. In addition, a Monte Carlo analysis was performed to determine the sensitivity of the electrical circuit to the variation of some parameters.In these analyzes were observed that for a tolerance of 20% in the device values and for 2σ above and below the median values(for both, width, and initial frequency value of fractal zone) it is noticed a deviation of 18% and -14%, respectively, which is areasonable deviation for a group that contains more than 90% of the samples.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Journal of Integrated Circuits and Systems Engineering-Electrical and Electronic Engineering

CiteScore

0.90

自引率

0.00%

发文量

期刊介绍： This journal will present state-of-art papers on Integrated Circuits and Systems. It is an effort of both Brazilian Microelectronics Society - SBMicro and Brazilian Computer Society - SBC to create a new scientific journal covering Process and Materials, Device and Characterization, Design, Test and CAD of Integrated Circuits and Systems. The Journal of Integrated Circuits and Systems is published through Special Issues on subjects to be defined by the Editorial Board. Special issues will publish selected papers from both Brazilian Societies annual conferences, SBCCI - Symposium on Integrated Circuits and Systems and SBMicro - Symposium on Microelectronics Technology and Devices.