影响厚度对酞菁镍薄膜结构和电学特性的影响

E. M. Nasir, M. Hussein, A. H. Al-Aarajiy
{"title":"影响厚度对酞菁镍薄膜结构和电学特性的影响","authors":"E. M. Nasir, M. Hussein, A. H. Al-Aarajiy","doi":"10.4236/AMPC.2019.97010","DOIUrl":null,"url":null,"abstract":"Thin films of Nickel Phthalocyanine have been prepared by evaporation technique for (50 - 350 nm) of thickness. XRD studies show that the thin films have single crystalline structure for low thicknesses with (100) orientation and the crystallite size increased with increased thickness. Also from the AFM technique for NiPc films, the roughness was determined and the grain size increases with increasing of thickness from except at thickness 350 nm. The studies of electrical properties, morphology and orientations of the crystallites are important to understand and predict the nature of the films and essential for their successful applications in solar cell and sensors. The electrical properties of these films were studied with different thickness, NiPc has three activation energy. Carrier’s concentration and mobility was calculated. Hall measurements showed that all the films are p-type.","PeriodicalId":68199,"journal":{"name":"材料物理与化学进展(英文)","volume":" ","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2019-07-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Impact Thickness on Structural and Electrical Characterization of Nickel Phthalocyanine Thin Films\",\"authors\":\"E. M. Nasir, M. Hussein, A. H. Al-Aarajiy\",\"doi\":\"10.4236/AMPC.2019.97010\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Thin films of Nickel Phthalocyanine have been prepared by evaporation technique for (50 - 350 nm) of thickness. XRD studies show that the thin films have single crystalline structure for low thicknesses with (100) orientation and the crystallite size increased with increased thickness. Also from the AFM technique for NiPc films, the roughness was determined and the grain size increases with increasing of thickness from except at thickness 350 nm. The studies of electrical properties, morphology and orientations of the crystallites are important to understand and predict the nature of the films and essential for their successful applications in solar cell and sensors. The electrical properties of these films were studied with different thickness, NiPc has three activation energy. Carrier’s concentration and mobility was calculated. Hall measurements showed that all the films are p-type.\",\"PeriodicalId\":68199,\"journal\":{\"name\":\"材料物理与化学进展(英文)\",\"volume\":\" \",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-07-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"材料物理与化学进展(英文)\",\"FirstCategoryId\":\"1087\",\"ListUrlMain\":\"https://doi.org/10.4236/AMPC.2019.97010\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"材料物理与化学进展(英文)","FirstCategoryId":"1087","ListUrlMain":"https://doi.org/10.4236/AMPC.2019.97010","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

采用蒸发法制备了厚度为(50 ~ 350nm)的酞菁镍薄膜。XRD研究表明,薄膜具有(100)取向的低厚度单晶结构,晶粒尺寸随厚度的增加而增大。此外,利用AFM技术测定了nic薄膜的粗糙度和晶粒尺寸,除厚度为350 nm外,随厚度的增加而增大。电学性质、形貌和取向的研究对于理解和预测薄膜的性质具有重要意义,对其在太阳能电池和传感器中的成功应用至关重要。研究了不同厚度薄膜的电学性能,NiPc具有三个活化能。计算了载体的浓度和迁移率。霍尔测量表明,所有薄膜均为p型。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Impact Thickness on Structural and Electrical Characterization of Nickel Phthalocyanine Thin Films
Thin films of Nickel Phthalocyanine have been prepared by evaporation technique for (50 - 350 nm) of thickness. XRD studies show that the thin films have single crystalline structure for low thicknesses with (100) orientation and the crystallite size increased with increased thickness. Also from the AFM technique for NiPc films, the roughness was determined and the grain size increases with increasing of thickness from except at thickness 350 nm. The studies of electrical properties, morphology and orientations of the crystallites are important to understand and predict the nature of the films and essential for their successful applications in solar cell and sensors. The electrical properties of these films were studied with different thickness, NiPc has three activation energy. Carrier’s concentration and mobility was calculated. Hall measurements showed that all the films are p-type.
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