{"title":"一种利用微滑动机构评估电触点退化现象的方法-对输入波形的最小滑动幅度(2)","authors":"S. Wada, K. Sawa","doi":"10.1587/TRANSELE.E100.C.723","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":50384,"journal":{"name":"IEICE Transactions on Electronics","volume":"100 1","pages":"723-731"},"PeriodicalIF":0.6000,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Method for Evaluating Degradation Phenomenon of Electrical Contacts Using a Micro-Sliding Mechanism — Minimal Sliding Amplitudes against Input Waveforms (2) —\",\"authors\":\"S. Wada, K. Sawa\",\"doi\":\"10.1587/TRANSELE.E100.C.723\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":50384,\"journal\":{\"name\":\"IEICE Transactions on Electronics\",\"volume\":\"100 1\",\"pages\":\"723-731\"},\"PeriodicalIF\":0.6000,\"publicationDate\":\"2016-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEICE Transactions on Electronics\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1587/TRANSELE.E100.C.723\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEICE Transactions on Electronics","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1587/TRANSELE.E100.C.723","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
A Method for Evaluating Degradation Phenomenon of Electrical Contacts Using a Micro-Sliding Mechanism — Minimal Sliding Amplitudes against Input Waveforms (2) —
期刊介绍:
Currently, the IEICE has ten sections nationwide. Each section operates under the leadership of a section chief, four section secretaries and about 20 section councilors. Sections host lecture meetings, seminars and industrial tours, and carry out other activities.
Topics:
Integrated Circuits, Semiconductor Materials and Devices, Quantum Electronics, Opto-Electronics, Superconductive Electronics, Electronic Displays, Microwave and Millimeter Wave Technologies, Vacuum and Beam Technologies, Recording and Memory Technologies, Electromagnetic Theory.