溶胶-凝胶法沉积含氟氧化锡薄膜

A. Adjimi, M. L. Zeggar, N. Attaf, M. Aida
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引用次数: 26

摘要

本文以(SnCl2, H2O), (NH4F)和乙醇混合物为溶剂,采用溶胶-凝胶法制备了未掺杂(SnO2)和掺氟氧化锡(FTO)薄膜。研究了氟浓度对SnO2薄膜结构、光学和电学性能的影响。溶胶-凝胶法制备的FTO薄膜的电学性能相对较低。在本文中,我们试图阐明这一区别。薄膜的组成和生长过程中形成的析出物的FTIR分析表明,SnO2网络中含有少量的氟,大部分氟原子留在溶液中。未掺杂FTO时,薄膜的电阻率为1.1 Ω·cm,掺杂50% FTO时,薄膜的电阻率为3 × 10-2 Ω·cm,但仍高于文献报道。这种高电阻率是根据氟在溶液中的键合亲和力来解释的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Fluorine-Doped Tin Oxide Thin Films Deposition by Sol-Gel Technique
In the present work, undoped (SnO2) and fluorine-doped tin oxide (FTO) thin films were prepared by sol-gel process using a solution composed of (SnCl2, H2O), (NH4F), and ethanol mixture. The fluorine concentration effect on structural, optical and electrical properties of SnO2 films is investigated. The electrical properties of FTO films prepared by sol gel remain relatively lower than the ones deposited by other techniques. In present paper, we try to elucidate this difference. Films composition and the FTIR analysis, of films and formed precipitate during film growth, indicate that few amounts of fluorine are incorporated in SnO2 network, most of fluorine atoms remain in the solution. The films resistivity is reduced from 1.1 Ω·cm for undoped films to 3 × 10-2 Ω·cm for 50 wt.% doped FTO, but remains higher than the reported ones in the literature. This high resistivity is explained in terms of fluorine bonding affinity in the solution.
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