H. Brunckova, M. Kaňuchová, H. Kolev, E. Múdra, A. Kovalčíková, Ľ. Medvecký
{"title":"化学溶液沉积制备铌酸铕薄膜的x射线光电子能谱研究","authors":"H. Brunckova, M. Kaňuchová, H. Kolev, E. Múdra, A. Kovalčíková, Ľ. Medvecký","doi":"10.2478/pmp-2020-0009","DOIUrl":null,"url":null,"abstract":"Abstract Transparent europium niobate EuNbO4 (ENOF) thin film (~100 nm) was prepared by sol-gel/spin-coating process on alumina substrates with PbZrO3 (PZ) interlayer and annealing at 1000°C. The X-ray diffraction (XRD) analyses verified the formation of the monoclinic M-EuNbO4 and tetragonal T-EuNb5O14 phases in ENO precursor and ENOF film. The surface morphology of powder precursor and microstructure of film were investigated by SEM analyses. Surface chemistry was investigated by X-ray photoelectron spectroscopy (XPS). The XPS demonstrated two valence states of Eu (Eu3+/Eu2+) in powder precursor as nanophosphor for lighting and display technologies. Eu concentration (at. %) decreases from 10 % in the precursor to 2 % in the film considering the substrate contains C, Al, Si, Pb, and Zr elements (40 %) at Nb (6 %) and O (52 %). The single valence state of Eu3+ was confirmed in ENO film designed for the application in environmental electrolytic thin-film devices.","PeriodicalId":52175,"journal":{"name":"Powder Metallurgy Progress","volume":"20 1","pages":"94 - 103"},"PeriodicalIF":0.0000,"publicationDate":"2020-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"X-ray Photoelectron Spectroscopy Study of Europium Niobate Thin Film Prepared by Chemical Solution Deposition\",\"authors\":\"H. Brunckova, M. Kaňuchová, H. Kolev, E. Múdra, A. Kovalčíková, Ľ. Medvecký\",\"doi\":\"10.2478/pmp-2020-0009\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Abstract Transparent europium niobate EuNbO4 (ENOF) thin film (~100 nm) was prepared by sol-gel/spin-coating process on alumina substrates with PbZrO3 (PZ) interlayer and annealing at 1000°C. The X-ray diffraction (XRD) analyses verified the formation of the monoclinic M-EuNbO4 and tetragonal T-EuNb5O14 phases in ENO precursor and ENOF film. The surface morphology of powder precursor and microstructure of film were investigated by SEM analyses. Surface chemistry was investigated by X-ray photoelectron spectroscopy (XPS). The XPS demonstrated two valence states of Eu (Eu3+/Eu2+) in powder precursor as nanophosphor for lighting and display technologies. Eu concentration (at. %) decreases from 10 % in the precursor to 2 % in the film considering the substrate contains C, Al, Si, Pb, and Zr elements (40 %) at Nb (6 %) and O (52 %). The single valence state of Eu3+ was confirmed in ENO film designed for the application in environmental electrolytic thin-film devices.\",\"PeriodicalId\":52175,\"journal\":{\"name\":\"Powder Metallurgy Progress\",\"volume\":\"20 1\",\"pages\":\"94 - 103\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Powder Metallurgy Progress\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.2478/pmp-2020-0009\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"Materials Science\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Powder Metallurgy Progress","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.2478/pmp-2020-0009","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"Materials Science","Score":null,"Total":0}
X-ray Photoelectron Spectroscopy Study of Europium Niobate Thin Film Prepared by Chemical Solution Deposition
Abstract Transparent europium niobate EuNbO4 (ENOF) thin film (~100 nm) was prepared by sol-gel/spin-coating process on alumina substrates with PbZrO3 (PZ) interlayer and annealing at 1000°C. The X-ray diffraction (XRD) analyses verified the formation of the monoclinic M-EuNbO4 and tetragonal T-EuNb5O14 phases in ENO precursor and ENOF film. The surface morphology of powder precursor and microstructure of film were investigated by SEM analyses. Surface chemistry was investigated by X-ray photoelectron spectroscopy (XPS). The XPS demonstrated two valence states of Eu (Eu3+/Eu2+) in powder precursor as nanophosphor for lighting and display technologies. Eu concentration (at. %) decreases from 10 % in the precursor to 2 % in the film considering the substrate contains C, Al, Si, Pb, and Zr elements (40 %) at Nb (6 %) and O (52 %). The single valence state of Eu3+ was confirmed in ENO film designed for the application in environmental electrolytic thin-film devices.
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