镉的电子散射截面:理论与实验

IF 4.4 2区工程技术 Q2 CHEMISTRY, MULTIDISCIPLINARY

Journal of Physical and Chemical Reference Data Pub Date : 2023-05-16 DOI:10.1063/5.0145933

B. Marinković, R. McEachran, D. Fursa, I. Bray, H. Umer, F. Blanco, G. García, M. Brunger, L. Campbell, D. B. Jones

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引用次数: 0

摘要

文中给出了光学势、相对论光学势、比较论收敛紧耦合和二元相遇Bethe模型在气相镉电子散射中的应用结果。特别是，在扩展的入射电子能量范围内，报道了弹性散射、离散电子态激发和电离散射过程的积分截面。总横截面是通过取其总和来构造的。给出了弹性散射和激发到51P1状态的测量结果。将理论和实验结果与以前的计算和测量结果进行了比较。推荐的电子截面数据集是在0.01–10的入射电子能量范围内构建的 000eV。

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Cross Sections for Electron Scattering from Cadmium: Theory and Experiment

Results from the application of optical potential, relativistic optical potential, relativistic convergent close-coupling, and binary encounter Bethe models to electron scattering from gas-phase cadmium are presented. In particular, integral cross sections for elastic scattering, summed discrete electronic-state excitation, and ionization scattering processes are reported over an extended incident electron-energy range. Total cross sections are constructed by taking their sum. Measurements are presented for elastic scattering and for excitation to the 51P1 state. The theoretical and experimental results are compared to previous calculations and measurements. Recommended electron cross-section datasets are constructed over an incident electron energy range of 0.01–10 000 eV.

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来源期刊

Journal of Physical and Chemical Reference Data 化学-化学综合

CiteScore

6.90

自引率

11.60%

发文量

审稿时长

>12 weeks

期刊介绍： The Journal of Physical and Chemical Reference Data (JPCRD) is published by AIP Publishing for the U.S. Department of Commerce National Institute of Standards and Technology (NIST). The journal provides critically evaluated physical and chemical property data, fully documented as to the original sources and the criteria used for evaluation, preferably with uncertainty analysis. Critical reviews may also be included if they document a reference database, review the data situation in a field, review reference-quality measurement techniques, or review data evaluation methods.