{"title":"第三代测序质量","authors":"A. Elbialy, M. El-Dosuky, I. El-Henawy","doi":"10.1166/JCTN.2020.9630","DOIUrl":null,"url":null,"abstract":"Third generation sequencing (TGS) relates to long reads but with relatively high error rates. Quality of TGS is a hot topic, dealing with errors. This paper combines and investigates three quality related metrics. They are basecalling accuracy, Phred Quality Scores, and GC content.\n For basecalling accuracy, a deep neural network is adopted. The measured loss does not exceed 5.42.","PeriodicalId":15416,"journal":{"name":"Journal of Computational and Theoretical Nanoscience","volume":"17 1","pages":"5205-5209"},"PeriodicalIF":0.0000,"publicationDate":"2020-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Quality of Third Generation Sequencing\",\"authors\":\"A. Elbialy, M. El-Dosuky, I. El-Henawy\",\"doi\":\"10.1166/JCTN.2020.9630\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Third generation sequencing (TGS) relates to long reads but with relatively high error rates. Quality of TGS is a hot topic, dealing with errors. This paper combines and investigates three quality related metrics. They are basecalling accuracy, Phred Quality Scores, and GC content.\\n For basecalling accuracy, a deep neural network is adopted. The measured loss does not exceed 5.42.\",\"PeriodicalId\":15416,\"journal\":{\"name\":\"Journal of Computational and Theoretical Nanoscience\",\"volume\":\"17 1\",\"pages\":\"5205-5209\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Computational and Theoretical Nanoscience\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1166/JCTN.2020.9630\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"Chemistry\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Computational and Theoretical Nanoscience","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1166/JCTN.2020.9630","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"Chemistry","Score":null,"Total":0}
Third generation sequencing (TGS) relates to long reads but with relatively high error rates. Quality of TGS is a hot topic, dealing with errors. This paper combines and investigates three quality related metrics. They are basecalling accuracy, Phred Quality Scores, and GC content.
For basecalling accuracy, a deep neural network is adopted. The measured loss does not exceed 5.42.