温度对TeO2薄膜结构、光学和NH3气敏性能的影响

Q4 Engineering
M. Manouchehrian
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引用次数: 1

摘要

采用热蒸发技术从Te粉末中沉积了不同温度(400、450和500°C)的TeO2薄膜。XRD图谱表明,随着温度的升高,结晶度提高。观察SEM获得的图像,可以看出晶粒尺寸随着温度的升高而减小。通过透射光谱和反射光谱测定了薄膜的光学能隙。随着温度的升高,光学能隙从3.95eV连续下降到3.80eV。研究沉积温度对NH3气体测量的影响,发现随着沉积温度的升高,灵敏度增加,响应时间和恢复时间减少。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Temperature effect on structural, optical and NH3 gas sensing properties of TeO2 thin films
TeO2 thin films with different temperatures (400, 450 and 500°C) were deposited on glass substrates by thermal evaporation technique from a Te powder. XRD patterns indicate that as the temperature increases, the crystallisation improves. Observing the images obtained by SEM, it is seen that the grain size decreases as the temperature increases. The optical energy gap of the films was determined from transmittance and reflectance spectra. The optical energy gap decreased continuously from 3.95 eV to 3.80 eV with increasing temperature. Studying the effect of deposition temperature on NH3 gas measurement, it became obvious that as the deposition temperature increases, the sensitivity increases and the response and recovery times decrease.
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