{"title":"电感耦合等离子体质谱中进样量对非光谱和光谱干扰的影响","authors":"D. Beauchemin","doi":"10.46770/as.2023.013","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":8642,"journal":{"name":"Atomic Spectroscopy","volume":null,"pages":null},"PeriodicalIF":3.4000,"publicationDate":"2023-02-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Effect Of Sample Injection Volume On Non-Spectroscopic And Spectroscopic Interferences In Inductively Coupled Plasma Mass Spectrometry\",\"authors\":\"D. Beauchemin\",\"doi\":\"10.46770/as.2023.013\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":8642,\"journal\":{\"name\":\"Atomic Spectroscopy\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":3.4000,\"publicationDate\":\"2023-02-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Atomic Spectroscopy\",\"FirstCategoryId\":\"92\",\"ListUrlMain\":\"https://doi.org/10.46770/as.2023.013\",\"RegionNum\":2,\"RegionCategory\":\"化学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"SPECTROSCOPY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Atomic Spectroscopy","FirstCategoryId":"92","ListUrlMain":"https://doi.org/10.46770/as.2023.013","RegionNum":2,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"SPECTROSCOPY","Score":null,"Total":0}
期刊介绍:
The ATOMIC SPECTROSCOPY is a peer-reviewed international journal started in 1962 by Dr. Walter Slavin and now is published by Atomic Spectroscopy Press Limited (ASPL). It is intended for the rapid publication of both original articles and review articles in the fields of AAS, AFS, ICP-OES, ICP-MS, GD-MS, TIMS, SIMS, AMS, LIBS, XRF and related techniques. Manuscripts dealing with (i) instrumentation & fundamentals, (ii) methodology development & applications, and (iii) standard reference materials (SRMs) development can be submitted for publication.