电分流防止单相脉冲微电流刺激后人皮肤成纤维细胞的流原性下降。

Eplasty Pub Date : 2022-07-12 eCollection Date: 2022-01-01
Mikiko Uemura, Masaharu Sugimoto, Yoshiyuki Yoshikawa, Rieko Inoue
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引用次数: 0

摘要

背景:电刺激(ES)疗法被推荐用于治疗压力性损伤。单相脉冲微电流刺激促进人类真皮成纤维细胞(HDFs)向阴极的迁移,而ES可能加速压力损伤的愈合。人体ES后会产生反向电流;然而,电分流在防止反向电流迁移方面的作用尚不清楚。因此,本研究旨在研究电分流对HDFs迁移的影响。方法:在分流组中,对HDFs进行0、200、400和600µA的电刺激8小时,并在ES后使用电分流器去除电。在延时显微镜下观察HDFs 24小时。计算了每个碟向阴极的迁移比。结果:200µA组细胞迁移率明显高于其他各组。在大于400µA ES的非分流组中,HDFs在ES后向阳极迁移;然而,HDFs没有通过电分流向阳极迁移。结论:ES后电分流在防止ES迁移效应下降方面很重要。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Electrical Shunting Prevents the Decline of Galvanotaxis After Monophasic Pulsed Microcurrent Stimulation in Human Dermal Fibroblasts.

Electrical Shunting Prevents the Decline of Galvanotaxis After Monophasic Pulsed Microcurrent Stimulation in Human Dermal Fibroblasts.

Electrical Shunting Prevents the Decline of Galvanotaxis After Monophasic Pulsed Microcurrent Stimulation in Human Dermal Fibroblasts.

Background: Electrical stimulation (ES) therapy is recommended for healing pressure injuries. Monophasic pulsed microcurrent stimulation promotes the migration of human dermal fibroblasts (HDFs) to the cathode, and ES potentially accelerates pressure injury healing. A reverse current is generated after ES in the human body; however, the effects of the electrical shunt in preventing the reverse current from migrating are unclear. Therefore, this study aimed to investigate the effects of an electrical shunt on the migration of HDFs.

Methods: In the shunt groups, HDFs were electrically stimulated (0, 200, 400, and 600 µA) for 8 hours, and an electrical shunt was used to remove the electricity after ES. HDFs were observed under time-lapse microscopy for 24 hours. The migration ratio toward the cathode was calculated for each dish.

Results: The migration ratio was significantly higher in the 200-µA group than in the other groups. HDFs migrated toward the anode after ES in the non-shunt groups with greater than 400 µA ES; however, HDFs did not migrate toward the anode with electrical shunting.

Conclusions: A post-ES electrical shunt is important in preventing a decline in the migration effect of ES.

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