亚表面激光雕刻dMiCE探测器的共光接口。

William C J Hunter, Robert S Miyaoka, Lawrence MacDonald, Wendy McDougald, Thomas K Lewellen
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引用次数: 0

摘要

我们之前已经报道过dMiCE,这是一种在一对离散晶体中通过编码光共享属性作为该晶体-元素对界面深度的函数来解决深度或相互作用(DOI)的方法。这种方法面临的挑战是对晶体对进行界面处理的成本和可重复性。在这项工作中,我们报告了我们使用亚表面激光雕刻(SSLE)作为在dMiCE探测器中形成这种深度依赖界面的手段的初步结果。使用剩余的第一代SSLE系统在1.4 × 2.9 × 20 mm × 3 LYSO晶体的两半之间的边界处创建了100微米厚的部分反射层。这些配对晶体元素的边界位于两个来自滨松的3毫米宽的盖格-迈勒雪崩光电二极管之间。这两个光电探测器的响应是在511 kev的光子系综上获得的,这些光子系综在一个晶体元件的固定深度上被校准相互作用。然后改变相互作用位置以测量探测器响应作为深度的函数,然后将其用于最大似然位置事件。尽管使用了次优的SSLE处理,我们发现正面读出的平均DOI分辨率为3.4 mm,背面读出的平均DOI分辨率为3.9 mm。我们期望通过优化SSLE过程和模式可以显著提高DOI分辨率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Light-Sharing Interface for dMiCE Detectors using Sub-Surface Laser Engraving.

Light-Sharing Interface for dMiCE Detectors using Sub-Surface Laser Engraving.

Light-Sharing Interface for dMiCE Detectors using Sub-Surface Laser Engraving.

We have previously reported on dMiCE, a method of resolving depth or interaction (DOI) in a pair of discrete crystals by encoding light sharing properties as a function of depth in the interface of this crystal-element pair. A challenge for this method is the cost and repeatability of interface treatment for a crystal pair. In this work, we report our preliminary results on using sub-surface laser engraving (SSLE) as a means of forming this depth-dependent interface in a dMiCE detector. A surplus first-generation SSLE system was used to create a partially reflective layer 100-microns thick at the boundary between two halves of a 1.4-by-2.9-by-20 mmˆ3 LYSO crystal. The boundary of these paired crystal elements was positioned between two 3-mm wide Geiger-Müller avalanche photodiodes from Hamamatsu. The responses of these two photodetectors were acquired for an ensemble of 511-keV photons collimated to interact at a fixed depth in just one crystal element. Interaction position was then varied to measure detector response as a function of depth, which was then used to maximum-likelihood positions events. Despite use of sub-optimal SSLE processing we found an average DOI resolution of 3.4 mm for front-sided readout and 3.9 mm for back-sided readout. We expect DOI resolution can be improved significantly by optimizing the SSLE process and pattern.

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