X-Enhanced ULite:改进表面缺陷的语义分割

IF 3 3区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Quwei Rao, Zhiwei Shi, Jing Ji
{"title":"X-Enhanced ULite:改进表面缺陷的语义分割","authors":"Quwei Rao,&nbsp;Zhiwei Shi,&nbsp;Jing Ji","doi":"10.1016/j.dsp.2025.105635","DOIUrl":null,"url":null,"abstract":"<div><div>In surface defect segmentation, achieving high accuracy while maintaining lightweight model characteristics is crucial for industrial applications. However, designing lightweight models that achieve high accuracy without compromising computational efficiency remains a significant challenge. In this work, we propose X-ULite, an enhanced version of the ULite framework, designed to improve both accuracy and efficiency in defect segmentation. The core innovation lies in the XConv module, which decouples main and anti-diagonal convolutions into independent depthwise branches, thereby preserving orientation-specific features that are crucial for representing cracks and scratches. Additionally, a new BottleNeck module integrates XConv with Axial Depthwise Convolution (AxialDW) and standard depthwise convolution, jointly modeling axial, diagonal, and local features to achieve a comprehensive perception of defect regions. Evaluated on industrial datasets, XULite achieves 85.98 % mIoU on steel surfaces (NEU-Seg), 75.07 % mIoU on Magnetic Tile Defect datasets, and 91.44 % mIoU on Mobile phone screen surface defect (MSD) datasets with only 0.97M parameters. The model maintains low computational complexity and parameters while demonstrating robust segmentation accuracy across diverse industrial scenarios.</div></div>","PeriodicalId":51011,"journal":{"name":"Digital Signal Processing","volume":"168 ","pages":"Article 105635"},"PeriodicalIF":3.0000,"publicationDate":"2025-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"X-Enhanced ULite: Improving semantic segmentation for surface defects\",\"authors\":\"Quwei Rao,&nbsp;Zhiwei Shi,&nbsp;Jing Ji\",\"doi\":\"10.1016/j.dsp.2025.105635\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>In surface defect segmentation, achieving high accuracy while maintaining lightweight model characteristics is crucial for industrial applications. However, designing lightweight models that achieve high accuracy without compromising computational efficiency remains a significant challenge. In this work, we propose X-ULite, an enhanced version of the ULite framework, designed to improve both accuracy and efficiency in defect segmentation. The core innovation lies in the XConv module, which decouples main and anti-diagonal convolutions into independent depthwise branches, thereby preserving orientation-specific features that are crucial for representing cracks and scratches. Additionally, a new BottleNeck module integrates XConv with Axial Depthwise Convolution (AxialDW) and standard depthwise convolution, jointly modeling axial, diagonal, and local features to achieve a comprehensive perception of defect regions. Evaluated on industrial datasets, XULite achieves 85.98 % mIoU on steel surfaces (NEU-Seg), 75.07 % mIoU on Magnetic Tile Defect datasets, and 91.44 % mIoU on Mobile phone screen surface defect (MSD) datasets with only 0.97M parameters. The model maintains low computational complexity and parameters while demonstrating robust segmentation accuracy across diverse industrial scenarios.</div></div>\",\"PeriodicalId\":51011,\"journal\":{\"name\":\"Digital Signal Processing\",\"volume\":\"168 \",\"pages\":\"Article 105635\"},\"PeriodicalIF\":3.0000,\"publicationDate\":\"2025-10-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Digital Signal Processing\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S1051200425006578\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digital Signal Processing","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1051200425006578","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

摘要

在表面缺陷分割中,在保持轻量化模型特性的同时实现高精度对于工业应用至关重要。然而,在不影响计算效率的情况下设计出高精度的轻量级模型仍然是一个重大挑战。在这项工作中,我们提出了X-ULite,这是ULite框架的增强版本,旨在提高缺陷分割的准确性和效率。核心创新在于XConv模块,它将主对角和反对角卷积解耦为独立的深度分支,从而保留了对表示裂缝和划痕至关重要的方向特定特征。此外,一个新的瓶颈模块将XConv与轴向深度卷积(AxialDW)和标准深度卷积集成在一起,共同建模轴向、对角和局部特征,以实现对缺陷区域的全面感知。在工业数据集上进行评估,XULite在钢表面(nue - seg)上的mIoU达到85.98%,在磁砖缺陷数据集上的mIoU达到75.07%,在手机屏幕表面缺陷(MSD)数据集上的mIoU达到91.44%,参数仅为0.97M。该模型保持了较低的计算复杂度和参数,同时在不同的工业场景中展示了稳健的分割精度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
X-Enhanced ULite: Improving semantic segmentation for surface defects
In surface defect segmentation, achieving high accuracy while maintaining lightweight model characteristics is crucial for industrial applications. However, designing lightweight models that achieve high accuracy without compromising computational efficiency remains a significant challenge. In this work, we propose X-ULite, an enhanced version of the ULite framework, designed to improve both accuracy and efficiency in defect segmentation. The core innovation lies in the XConv module, which decouples main and anti-diagonal convolutions into independent depthwise branches, thereby preserving orientation-specific features that are crucial for representing cracks and scratches. Additionally, a new BottleNeck module integrates XConv with Axial Depthwise Convolution (AxialDW) and standard depthwise convolution, jointly modeling axial, diagonal, and local features to achieve a comprehensive perception of defect regions. Evaluated on industrial datasets, XULite achieves 85.98 % mIoU on steel surfaces (NEU-Seg), 75.07 % mIoU on Magnetic Tile Defect datasets, and 91.44 % mIoU on Mobile phone screen surface defect (MSD) datasets with only 0.97M parameters. The model maintains low computational complexity and parameters while demonstrating robust segmentation accuracy across diverse industrial scenarios.
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来源期刊
Digital Signal Processing
Digital Signal Processing 工程技术-工程:电子与电气
CiteScore
5.30
自引率
17.20%
发文量
435
审稿时长
66 days
期刊介绍: Digital Signal Processing: A Review Journal is one of the oldest and most established journals in the field of signal processing yet it aims to be the most innovative. The Journal invites top quality research articles at the frontiers of research in all aspects of signal processing. Our objective is to provide a platform for the publication of ground-breaking research in signal processing with both academic and industrial appeal. The journal has a special emphasis on statistical signal processing methodology such as Bayesian signal processing, and encourages articles on emerging applications of signal processing such as: • big data• machine learning• internet of things• information security• systems biology and computational biology,• financial time series analysis,• autonomous vehicles,• quantum computing,• neuromorphic engineering,• human-computer interaction and intelligent user interfaces,• environmental signal processing,• geophysical signal processing including seismic signal processing,• chemioinformatics and bioinformatics,• audio, visual and performance arts,• disaster management and prevention,• renewable energy,
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