S. A. Evseev, B. A. Chernyshev, Yu. B. Gurov, M. S. Dovbnenko, S. V. Rozov, V. G. Sandukovsky
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Charge Losses in SiC and Si Detectors at Registration of Heavy Ions
The results of measurements of charge losses at registration of xenon ions (\({}^{132}\)Xe) with the energies of 44.5, 81.5 and 165 MeV in the detectors based on silicon carbide (SiC) and silicon (Si) are presented. The measured values of the amplitude defect for SiC and Si detectors are 43 and 21\(\%\) of the true \({}^{132}\)Xe ion energy, respectively. The reason is the incomplete collection of charge carriers due to their recombination in a dense track of the heavy ion being detected.
期刊介绍:
Physics of Atomic Nuclei is a journal that covers experimental and theoretical studies of nuclear physics: nuclear structure, spectra, and properties; radiation, fission, and nuclear reactions induced by photons, leptons, hadrons, and nuclei; fundamental interactions and symmetries; hadrons (with light, strange, charm, and bottom quarks); particle collisions at high and superhigh energies; gauge and unified quantum field theories, quark models, supersymmetry and supergravity, astrophysics and cosmology.