“硬”LLL干涉仪位错的x射线干涉成像

IF 0.4 4区物理与天体物理 Q4 PHYSICS, MULTIDISCIPLINARY

Journal of Contemporary Physics (Armenian Academy of Sciences) Pub Date : 2025-10-07 DOI:10.1134/S1068337225700471

T. H. Eyramjyan, T. S. Mnatsakanyan, L. A. Haroutunyan

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引用次数: 0

摘要

研究了一种由无位错硅单晶制成的“硬”LLL干涉仪；它与以前已知的x射线干涉仪有很大的不同。这种干涉仪对晶体中最初存在的和引入的缺陷都高度敏感。经x射线形貌图证实，在干涉仪镜面块的修改部分产生了几个位错。得到了镜块中产生的位错干涉图像。根据所考虑的方案进行了单边位错成像的数值模拟。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

X-Ray Interferometric Imaging of Dislocations Generated in “Hard” LLL Interferometer

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X-Ray Interferometric Imaging of Dislocations Generated in “Hard” LLL Interferometer

A “hard” LLL interferometer made of dislocation-free silicon single crystal has been investigated; it differs significantly from previously known types of X-ray interferometers. Such an interferometer is highly sensitive to both initially present and introduced defects in the crystal. Several dislocations were generated in the modified part of the interferometer’s mirror block, as confirmed by X-ray topograms. Interferometric images of dislocations generated in the mirror block were obtained. The numerical simulation of single edge dislocation imaging is carried out according to the considered scheme.

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来源期刊

Journal of Contemporary Physics (Armenian Academy of Sciences) PHYSICS, MULTIDISCIPLINARY-

CiteScore

1.00

自引率

66.70%

发文量

审稿时长

6-12 weeks

期刊介绍： Journal of Contemporary Physics (Armenian Academy of Sciences) is a journal that covers all fields of modern physics. It publishes significant contributions in such areas of theoretical and applied science as interaction of elementary particles at superhigh energies, elementary particle physics, charged particle interactions with matter, physics of semiconductors and semiconductor devices, physics of condensed matter, radiophysics and radioelectronics, optics and quantum electronics, quantum size effects, nanophysics, sensorics, and superconductivity.