Julio Martins;Josue Lopez-Cabrejos;Quefren Leher;Thuanne Paixão;Ana Beatriz Alvarez;Facundo Palomino-Quispe
{"title":"印刷电路板缺陷检测:深度卷积自适应目标检测模型的比较分析","authors":"Julio Martins;Josue Lopez-Cabrejos;Quefren Leher;Thuanne Paixão;Ana Beatriz Alvarez;Facundo Palomino-Quispe","doi":"10.1109/TLA.2025.11194776","DOIUrl":null,"url":null,"abstract":"Printed circuit boards (PCBs) are key components in the electronics industry, and ensuring their integrity is essential for reliable manufacturing. Automated inspection systems based on computer vision, although efficient, face challenges. In this scenario, deep learning techniques have become effective solutions for detecting defects in more modern and complex PCBs. This article presents a comparative study between the YOLOv8n, YOLOv11n and RT-DETRv2 models for identifying defects in PCBs. The experiments were conducted using the PKU-Market-PCB dataset, which includes Missing Hole, Mouse Bite, Open Circuit, Short Circuit, Spur and Spurious Copper defects. To reduce the computational cost, modified versions of YOLOv8n and YOLOv11n with Depthwise convolution blocks (YOLOv8-DWConv and YOLOv11-DWConv). The analysis includes quantitative and qualitative comparisons. In addition, the robustness of the models is evaluated under challenging conditions with blur and illumination gradient noise. The results indicate that YOLOv11n achieves the best overall performance, while YOLOv11n-DWConv offers a competitive balance between precision and computational efficiency.","PeriodicalId":55024,"journal":{"name":"IEEE Latin America Transactions","volume":"23 11","pages":"1001-1010"},"PeriodicalIF":1.3000,"publicationDate":"2025-10-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11194776","citationCount":"0","resultStr":"{\"title\":\"Defect Detection in Printed Circuit Boards: A Comparative Analysis of Object Detection Models with Depthwise Convolution Adaptation\",\"authors\":\"Julio Martins;Josue Lopez-Cabrejos;Quefren Leher;Thuanne Paixão;Ana Beatriz Alvarez;Facundo Palomino-Quispe\",\"doi\":\"10.1109/TLA.2025.11194776\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Printed circuit boards (PCBs) are key components in the electronics industry, and ensuring their integrity is essential for reliable manufacturing. Automated inspection systems based on computer vision, although efficient, face challenges. In this scenario, deep learning techniques have become effective solutions for detecting defects in more modern and complex PCBs. This article presents a comparative study between the YOLOv8n, YOLOv11n and RT-DETRv2 models for identifying defects in PCBs. The experiments were conducted using the PKU-Market-PCB dataset, which includes Missing Hole, Mouse Bite, Open Circuit, Short Circuit, Spur and Spurious Copper defects. To reduce the computational cost, modified versions of YOLOv8n and YOLOv11n with Depthwise convolution blocks (YOLOv8-DWConv and YOLOv11-DWConv). The analysis includes quantitative and qualitative comparisons. In addition, the robustness of the models is evaluated under challenging conditions with blur and illumination gradient noise. The results indicate that YOLOv11n achieves the best overall performance, while YOLOv11n-DWConv offers a competitive balance between precision and computational efficiency.\",\"PeriodicalId\":55024,\"journal\":{\"name\":\"IEEE Latin America Transactions\",\"volume\":\"23 11\",\"pages\":\"1001-1010\"},\"PeriodicalIF\":1.3000,\"publicationDate\":\"2025-10-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11194776\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Latin America Transactions\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/11194776/\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"COMPUTER SCIENCE, INFORMATION SYSTEMS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Latin America Transactions","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/11194776/","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, INFORMATION SYSTEMS","Score":null,"Total":0}
Defect Detection in Printed Circuit Boards: A Comparative Analysis of Object Detection Models with Depthwise Convolution Adaptation
Printed circuit boards (PCBs) are key components in the electronics industry, and ensuring their integrity is essential for reliable manufacturing. Automated inspection systems based on computer vision, although efficient, face challenges. In this scenario, deep learning techniques have become effective solutions for detecting defects in more modern and complex PCBs. This article presents a comparative study between the YOLOv8n, YOLOv11n and RT-DETRv2 models for identifying defects in PCBs. The experiments were conducted using the PKU-Market-PCB dataset, which includes Missing Hole, Mouse Bite, Open Circuit, Short Circuit, Spur and Spurious Copper defects. To reduce the computational cost, modified versions of YOLOv8n and YOLOv11n with Depthwise convolution blocks (YOLOv8-DWConv and YOLOv11-DWConv). The analysis includes quantitative and qualitative comparisons. In addition, the robustness of the models is evaluated under challenging conditions with blur and illumination gradient noise. The results indicate that YOLOv11n achieves the best overall performance, while YOLOv11n-DWConv offers a competitive balance between precision and computational efficiency.
期刊介绍:
IEEE Latin America Transactions (IEEE LATAM) is an interdisciplinary journal focused on the dissemination of original and quality research papers / review articles in Spanish and Portuguese of emerging topics in three main areas: Computing, Electric Energy and Electronics. Some of the sub-areas of the journal are, but not limited to: Automatic control, communications, instrumentation, artificial intelligence, power and industrial electronics, fault diagnosis and detection, transportation electrification, internet of things, electrical machines, circuits and systems, biomedicine and biomedical / haptic applications, secure communications, robotics, sensors and actuators, computer networks, smart grids, among others.