Huynh Thanh Nhan, Nguyen Duy Thong, Le Hoang Minh, Tran Thien Thanh, Chau van Tao
求助PDF
{"title":"利用机器学习对基于伽马散射光谱的材料进行分类","authors":"Huynh Thanh Nhan, Nguyen Duy Thong, Le Hoang Minh, Tran Thien Thanh, Chau van Tao","doi":"10.1002/tee.70120","DOIUrl":null,"url":null,"abstract":"<p>In this study, machine learning is used to determine materials and thickness of materials based on gamma scattering spectra. Materials used in this study are: Al, Si, Fe, Mn, Mg, Co, Cu, Zn, and Ti, which have thicknesses varying from 1 mm to 50 mm. In order to estimate thickness as well as material simultaneously, 1-scattering spectrum and 2-scattering spectrum are used. The Random Forest algorithm was used in training and evaluating the machine learning model. Results of this study provided a coefficient of determination <i>R</i><sup>2</sup> = 0.990 and mean squared error MSE = 1.250. © 2025 Institute of Electrical Engineers of Japan and Wiley Periodicals LLC.</p>","PeriodicalId":13435,"journal":{"name":"IEEJ Transactions on Electrical and Electronic Engineering","volume":"20 11","pages":"1933-1936"},"PeriodicalIF":1.1000,"publicationDate":"2025-07-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Use Machine Learning to Classify Materials Based on Gamma Scattering Spectra\",\"authors\":\"Huynh Thanh Nhan, Nguyen Duy Thong, Le Hoang Minh, Tran Thien Thanh, Chau van Tao\",\"doi\":\"10.1002/tee.70120\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>In this study, machine learning is used to determine materials and thickness of materials based on gamma scattering spectra. Materials used in this study are: Al, Si, Fe, Mn, Mg, Co, Cu, Zn, and Ti, which have thicknesses varying from 1 mm to 50 mm. In order to estimate thickness as well as material simultaneously, 1-scattering spectrum and 2-scattering spectrum are used. The Random Forest algorithm was used in training and evaluating the machine learning model. Results of this study provided a coefficient of determination <i>R</i><sup>2</sup> = 0.990 and mean squared error MSE = 1.250. © 2025 Institute of Electrical Engineers of Japan and Wiley Periodicals LLC.</p>\",\"PeriodicalId\":13435,\"journal\":{\"name\":\"IEEJ Transactions on Electrical and Electronic Engineering\",\"volume\":\"20 11\",\"pages\":\"1933-1936\"},\"PeriodicalIF\":1.1000,\"publicationDate\":\"2025-07-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEJ Transactions on Electrical and Electronic Engineering\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://onlinelibrary.wiley.com/doi/10.1002/tee.70120\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEJ Transactions on Electrical and Electronic Engineering","FirstCategoryId":"5","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1002/tee.70120","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
引用
批量引用