数据溯源是可信计量数据的科学基础——对未来计量方向的展望。

IF 2.5 4区 计算机科学 Q2 COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE
PeerJ Computer Science Pub Date : 2025-08-14 eCollection Date: 2025-01-01 DOI:10.7717/peerj-cs.3106
Zhanshuo Cao, Boyong Gao, Zilong Liu, Xingchuang Xiong, Bin Wang, Chenbo Pei
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引用次数: 0

摘要

在计量数字化转型的背景下,确保测量数据在产生、传输和存储过程中的可靠性和完整性。,测量数据的可靠检测已成为一个关键的挑战。数据痕迹是在数据处理过程中留下的残留标记,有助于识别针对测量数据的恶意活动。当潜在数据证据的信任和完整性受到威胁时,这些痕迹尤为重要。为此,本文系统回顾了相关核心技术,并分析了数据生命周期不同阶段的各种检测方法,评估了它们在识别数据篡改、未经授权访问和异常操作方面的适用性和局限性。研究结果表明,痕量检测技术可以提高计量数据的可追溯性和透明度,从而为建立可信赖的数字计量系统提供技术支持。本文综述为未来开发自动化异常检测模型、改进测量设备数据篡改的取证技术以及构建多模态、全生命周期的测量数据可追溯框架奠定了理论基础。后续的研究应该集中在将这些技术与计量标准结合起来,并验证它们在实际测量仪器中的部署。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Data trace as the scientific foundation for trusted metrological data: a review for future metrology direction.

In the context of the digital transformation of metrology, ensuring the trustworthiness and integrity of measurement data during its generation, transmission, and storage-i.e., trustworthy detection of measurement data-has become a critical challenge. Data traces are residual marks left during the data processing, which help identify malicious activities targeting measurement data. These traces are especially important when the trust and integrity of potential data evidence are under threat. To this end, this article systematically reviews relevant core techniques and analyzes various detection methods across the different stages of the data lifecycle, evaluating their applicability and limitations in identifying data tampering, unauthorized access, and anomalous operations. The findings suggest that trace detection technologies can enhance the traceability and transparency of metrological data, thereby providing technical support for building a trustworthy digital metrology system. This review lays the theoretical foundation for future research on developing automated anomaly detection models, improving forensic techniques for data tampering in measurement devices, and constructing multi-modal, full-lifecycle traceability frameworks for measurement data. Subsequent studies should focus on aligning these technologies with metrological standards and verifying their deployment in real-world measurement instruments.

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来源期刊
PeerJ Computer Science
PeerJ Computer Science Computer Science-General Computer Science
CiteScore
6.10
自引率
5.30%
发文量
332
审稿时长
10 weeks
期刊介绍: PeerJ Computer Science is the new open access journal covering all subject areas in computer science, with the backing of a prestigious advisory board and more than 300 academic editors.
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