展示计量学在展示周上跨越了整个范围

Q4 Engineering

Information Display Pub Date : 2025-09-23 DOI:10.1002/msid.1615

Tom Fiske

引用次数: 0

摘要

标准、反射伪影、空间干扰和新的测量仪器捕捉了想象力。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

Display Metrology Spans the Gamut at Display Week

查看原文本刊更多论文

Display Metrology Spans the Gamut at Display Week

Standards, reflection artifacts, spatial interference, and new measurement instruments capture the imagination.

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来源期刊

Information Display Engineering-Electrical and Electronic Engineering

CiteScore

1.40

自引率

0.00%

发文量

期刊介绍： Information Display Magazine invites other opinions on editorials or other subjects from members of the international display community. We welcome your comments and suggestions.