多功能高强低z复合材料在近地轨道上屏蔽电离粒子的能力

IF 3.4 2区 物理与天体物理 Q1 ENGINEERING, AEROSPACE
Jarrod Moonen , Andrea Mazzanti , Jafar Shojaii , Simon Barter , Shannon Ryan , Crystal Forrester , Pier Marzocca , Alex Shekhter
{"title":"多功能高强低z复合材料在近地轨道上屏蔽电离粒子的能力","authors":"Jarrod Moonen ,&nbsp;Andrea Mazzanti ,&nbsp;Jafar Shojaii ,&nbsp;Simon Barter ,&nbsp;Shannon Ryan ,&nbsp;Crystal Forrester ,&nbsp;Pier Marzocca ,&nbsp;Alex Shekhter","doi":"10.1016/j.actaastro.2025.08.055","DOIUrl":null,"url":null,"abstract":"<div><div>The ionization shielding performance of orbital debris (OD) shields, containing Ultrahigh Molecular Weight Polyethylene (UHMWPE) and aramid, have been investigated. We report the SRIM-2013 numerical simulation of the protons and heavy ions interaction with the shield, based on the description of the orbital ion environment for the analogue satellite NOVASAR-1, validated by experimentation at the Australia National University’s Heavy Ion Accelerator Facility Space Radiation Beamline. The suitability of the structures as ionizing radiation shields were measured on two metrics induced in a notional commercial-off-the-shelf (COTS) Integrated Circuit chip (IC) and Radiation Hardened (RH) IC relative to a no-shield baseline: (1) change in Soft Error Rate (SER) using SER cross-section data for chip architectures published in literature, and (2) change in Total Ionizing Dose (TID) over a notional mission time frame. The analysis finds the all considered shields increase the SER for the RH chip architecture by approx. 20%, while an approx. 1.5% drop in SER independent of the shield constituent materials analysed was predicted in the COTS case. A significant drop in TID (68%–83%) was predicted due to the presence of a shielding structure, with the UHMWPE shield outperforming the aramid shield by a functionally negligible 2%.</div></div>","PeriodicalId":44971,"journal":{"name":"Acta Astronautica","volume":"238 ","pages":"Pages 598-607"},"PeriodicalIF":3.4000,"publicationDate":"2025-09-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The ionizing particle shielding capability of multi-functional high-strength and low-Z composites in low earth orbit\",\"authors\":\"Jarrod Moonen ,&nbsp;Andrea Mazzanti ,&nbsp;Jafar Shojaii ,&nbsp;Simon Barter ,&nbsp;Shannon Ryan ,&nbsp;Crystal Forrester ,&nbsp;Pier Marzocca ,&nbsp;Alex Shekhter\",\"doi\":\"10.1016/j.actaastro.2025.08.055\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>The ionization shielding performance of orbital debris (OD) shields, containing Ultrahigh Molecular Weight Polyethylene (UHMWPE) and aramid, have been investigated. We report the SRIM-2013 numerical simulation of the protons and heavy ions interaction with the shield, based on the description of the orbital ion environment for the analogue satellite NOVASAR-1, validated by experimentation at the Australia National University’s Heavy Ion Accelerator Facility Space Radiation Beamline. The suitability of the structures as ionizing radiation shields were measured on two metrics induced in a notional commercial-off-the-shelf (COTS) Integrated Circuit chip (IC) and Radiation Hardened (RH) IC relative to a no-shield baseline: (1) change in Soft Error Rate (SER) using SER cross-section data for chip architectures published in literature, and (2) change in Total Ionizing Dose (TID) over a notional mission time frame. The analysis finds the all considered shields increase the SER for the RH chip architecture by approx. 20%, while an approx. 1.5% drop in SER independent of the shield constituent materials analysed was predicted in the COTS case. A significant drop in TID (68%–83%) was predicted due to the presence of a shielding structure, with the UHMWPE shield outperforming the aramid shield by a functionally negligible 2%.</div></div>\",\"PeriodicalId\":44971,\"journal\":{\"name\":\"Acta Astronautica\",\"volume\":\"238 \",\"pages\":\"Pages 598-607\"},\"PeriodicalIF\":3.4000,\"publicationDate\":\"2025-09-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Acta Astronautica\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0094576525005636\",\"RegionNum\":2,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, AEROSPACE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Acta Astronautica","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0094576525005636","RegionNum":2,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, AEROSPACE","Score":null,"Total":0}
引用次数: 0

摘要

研究了含超高分子量聚乙烯(UHMWPE)和芳纶的轨道碎片(OD)屏蔽层的电离屏蔽性能。我们报告了基于模拟卫星NOVASAR-1轨道离子环境描述的质子和重离子与屏蔽相互作用的SRIM-2013数值模拟,并通过澳大利亚国立大学重离子加速器设施空间辐射光束线的实验验证。通过两项指标来衡量结构作为电离辐射屏蔽的适用性,这两项指标是相对于无屏蔽基线,在一个概念上的商用现成(COTS)集成电路芯片(IC)和辐射硬化(RH) IC中产生的:(1)软错误率(SER)的变化,使用文献中发表的芯片架构的SER截面数据,以及(2)在一个概念的任务时间框架内总电离剂量(TID)的变化。分析发现,所有考虑的屏蔽增加了大约RH芯片架构的SER。20%,而大约。预计在COTS情况下,与屏蔽成分材料无关的SER下降1.5%。由于屏蔽结构的存在,预测TID显著下降(68%-83%),其中UHMWPE屏蔽性能优于芳纶屏蔽,在功能上可以忽略2%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The ionizing particle shielding capability of multi-functional high-strength and low-Z composites in low earth orbit
The ionization shielding performance of orbital debris (OD) shields, containing Ultrahigh Molecular Weight Polyethylene (UHMWPE) and aramid, have been investigated. We report the SRIM-2013 numerical simulation of the protons and heavy ions interaction with the shield, based on the description of the orbital ion environment for the analogue satellite NOVASAR-1, validated by experimentation at the Australia National University’s Heavy Ion Accelerator Facility Space Radiation Beamline. The suitability of the structures as ionizing radiation shields were measured on two metrics induced in a notional commercial-off-the-shelf (COTS) Integrated Circuit chip (IC) and Radiation Hardened (RH) IC relative to a no-shield baseline: (1) change in Soft Error Rate (SER) using SER cross-section data for chip architectures published in literature, and (2) change in Total Ionizing Dose (TID) over a notional mission time frame. The analysis finds the all considered shields increase the SER for the RH chip architecture by approx. 20%, while an approx. 1.5% drop in SER independent of the shield constituent materials analysed was predicted in the COTS case. A significant drop in TID (68%–83%) was predicted due to the presence of a shielding structure, with the UHMWPE shield outperforming the aramid shield by a functionally negligible 2%.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
Acta Astronautica
Acta Astronautica 工程技术-工程:宇航
CiteScore
7.20
自引率
22.90%
发文量
599
审稿时长
53 days
期刊介绍: Acta Astronautica is sponsored by the International Academy of Astronautics. Content is based on original contributions in all fields of basic, engineering, life and social space sciences and of space technology related to: The peaceful scientific exploration of space, Its exploitation for human welfare and progress, Conception, design, development and operation of space-borne and Earth-based systems, In addition to regular issues, the journal publishes selected proceedings of the annual International Astronautical Congress (IAC), transactions of the IAA and special issues on topics of current interest, such as microgravity, space station technology, geostationary orbits, and space economics. Other subject areas include satellite technology, space transportation and communications, space energy, power and propulsion, astrodynamics, extraterrestrial intelligence and Earth observations.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信