光谱域光学相干层析成像中子盒的光谱泄漏对深度剖面的应用。

Applied optics Pub Date : 2025-09-01 DOI:10.1364/AO.567846
Manabu Sato, Kouhei Kawada, Junpei Masuta, Tetsuo Kosaka
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引用次数: 0

摘要

我们提出了一种振幅信噪比(a - snr)方法,利用谱域光学相干层析成像(SD-OCT)中的子盒(SB)来利用深度剖面中的频谱泄漏分量。将常规的bin间隔除以SB,并采用矩形谱密度。对稳态条件下的幅值和信噪比进行了理论推导,并给出了仿真结果。在实验中,使用SLD为0.8µm的SD-OCT,在常规深度分辨率为19.1µm的情况下,使用该方法测量了2-3µm深度的位移。文中还讨论了a -信噪比方法的应用实例。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Utility of spectral leakages to the depth profile using sub-bin in spectral-domain optical coherence tomography.

We propose an amplitude-signal-to-noise ratio (A-SNR) method to utilize the spectral leakage components in the depth profile using a sub-bin (SB) in spectral domain optical coherence tomography (SD-OCT). The conventional bin interval was divided by the SB, and a rectangular spectral density was used. The amplitude and SNR under SB conditions were derived theoretically, and the simulation results are presented. In experiments, using SD-OCT with a 0.8 µm SLD, for the conventional depth resolution of 19.1 µm, the displacements of 2-3 µm in depth were measured using the proposed method. The example of applications of the A-SNR method is also discussed.

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