A new EBSD indexing method with enhanced grain boundary indexing performance using a three-dimensional parameter space

Electron backscatter diffraction (EBSD) is an important technique based on the scanning electron microscope (SEM) that provides a wide range of crystallographic information. There are limited available pattern indexing methods and most of them are mastered by commercial instrument manufacturers, which may probably restrict the sharing and development of indexing techniques. In this study, we present a new EBSD pattern indexing method based on a three-dimensional parameter space. This method extends the characterization of characteristic triangles into a three-dimensional parameter space. This work details the procedure of the new indexing algorithm. The utility of this new method is demonstrated using experimental patterns captured from a cubic yttria-stabilized zirconia (YSZ) bulk sample. Compared with commercial indexing results, the new method shows excellent consistency and achieves better indexing performance at grain boundaries.