范德华铁磁体Fe3GeTe2的电阻异常和迭代电阻滞后

IF 3.2 3区 化学 Q2 CHEMISTRY, PHYSICAL
Rashed H. Lone*, B. Manoj Kumar, Shreya Gaonkar and E. S. Kannan, 
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引用次数: 0

摘要

我们报道了氧化范德华铁磁体Fe3GeTe2 (FGT)在零磁场下的纵向电阻(Rxx)的有趣异常(B)。在铁磁阶段观察到的这种异常表现为Rxx在50 K左右急剧增加。值得注意的是,Rxx在升温周期中一直处于这种高阻状态,即使系统进入顺磁阶段也没有复位,说明这是一个不可逆的过程。这种行为是由于在表面氧化反铁磁层和底层FGT之间的界面处形成了弱局域电子态。随着连续的热循环(300-4 K),电阻跳变的幅度逐渐减小,并在第四次循环时被完全抑制。相比之下,原始的、未氧化的FGT薄片没有表现出这种异常,证实了表面氧化在调节电阻状态中的关键作用。此外,测量Rxx作为低于居里温度的磁场的函数,揭示了载流子定位、界面无序和陷阱辅助传导可能的综合影响──特别是在剥离的FGT薄片中存在表面氧化和无序的情况下──以及在零场附近电阻的显著增加。这些观察结果表明,氧化FGT的氧化物界面上存在定位位点,为电子传输行为和电子和自旋电子器件的潜在应用提供了有价值的见解。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Resistance Anomaly and Iterative Resistance Hysteresis in van der Waals Ferromagnet Fe3GeTe2

We report an intriguing anomaly in the longitudinal resistance (Rxx) of the oxidized van der Waals ferromagnet Fe3GeTe2 (FGT) at a zero magnetic field (B). This anomaly, observed within the ferromagnetic phase, appeared as a sharp increase in Rxx around 50 K. Notably, Rxx remained in this high-resistance state during the warming cycle and did not RESET even after the system transitioned into the paramagnetic phase, indicating an irreversible process. This behavior is attributed to the formation of weakly localized electronic states at the interface between the surface-oxidized antiferromagnetic layer and the underlying FGT. With successive thermal cycles (300–4 K), the magnitude of the resistance jump gradually diminished and was fully suppressed by the fourth run. In contrast, pristine, nonoxidized FGT flakes exhibited no such anomaly, confirming the crucial role of surface oxidation in modulating the resistance state. Additionally, measurements of Rxx as a function of magnetic field below the Curie temperature revealed possible combined effects of carrier localization, interfacial disorder, and trap-assisted conduction─particularly in the presence of surface oxidation and disorder in exfoliated FGT flakes─along with a pronounced increase in resistance near zero field. These observations point to the presence of localization sites at the oxide interface in oxidized FGT, offering valuable insights into electron transport behavior and potential applications in electronic and spintronic devices.

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来源期刊
The Journal of Physical Chemistry C
The Journal of Physical Chemistry C 化学-材料科学:综合
CiteScore
6.50
自引率
8.10%
发文量
2047
审稿时长
1.8 months
期刊介绍: The Journal of Physical Chemistry A/B/C is devoted to reporting new and original experimental and theoretical basic research of interest to physical chemists, biophysical chemists, and chemical physicists.
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