铜和硫化铜薄膜的溶液沉积:硫脲的影响

IF 3.2 3区 化学 Q2 CHEMISTRY, PHYSICAL
Jevalyne Vienes,  and , Amy V. Walker*, 
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引用次数: 0

摘要

化学沉积在工业过程中广泛应用于有机层的金属化。这是一种有吸引力的沉积金属覆盖层的技术,因为它可以在低温下进行,价格低廉,并且与各种材料兼容。镀液添加剂通常用于改变沉积膜的形态和性能,以及控制膜生长的动力学和机制。硫脲是化学沉积中常用的镀液添加剂,通常用作流平剂和光亮剂,以产生更均匀的反射膜。我们研究了硫脲在以二甲基胺硼烷为还原剂的- CH3-, - OH-和- cooh端自组装单层(SAMs)吸附在金上的化学沉积中的作用。利用x射线光电子能谱(XPS)、拉曼光谱、光学显微镜和扫描电镜(SEM),我们证明硫脲显著降低了薄膜的沉积速率。此外,对于所研究的所有镀液pH值,沉积物组成强烈依赖于镀液中硫脲的浓度。在10-2 M硫脲下,铜膜沉积在所有衬底上,并进行pH研究。≥10-2 M时,沉积层为硫化铜。在pH 5和pH 9时,所有功能化SAMs的沉积物都由cu组成,而在pH 12时,沉积物则由Cu2S组成。我们提出,硫脲的主导作用随着其在镀液中的浓度而变化,导致观察到的沉积物组成对硫脲浓度的强烈依赖性。在低硫脲浓度下,它作为络合还原剂,而在高浓度(10-2 M)下,主要反应是硫脲水解,导致硫化物铜的形成。最后,我们演示了一种简单的方法,通过控制镀液中的硫脲浓度来沉积层状Cu/CuxS和Cu纳米线。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Solution Depositions of Copper and Copper Sulfide Thin Films: Effects of Thiourea

Solution Depositions of Copper and Copper Sulfide Thin Films: Effects of Thiourea

Electroless deposition is widely used in industrial processes for the metallization of organic layers. It is an attractive technique to deposit metal overlayers because it can be performed at low temperatures, is inexpensive, and is compatible with a wide range of materials. Bath additives are often employed to alter the morphology and properties of a deposited film as well as control the kinetics and mechanisms of the film growth. Thiourea is a common bath additive in electroless deposition and is commonly employed as a leveling agent and brightener to produce more uniform reflective films. We have investigated the role of thiourea on the electroless deposition of copper on −CH3-, −OH-, and −COOH-terminated self-assembled monolayers (SAMs) adsorbed on gold using dimethylamine borane as a reducing agent. Using X-ray photoelectron spectroscopy (XPS), Raman spectroscopy, optical microscopy, and scanning electron microscopy (SEM), we demonstrate that thiourea decreases the film deposition rate significantly. Further, for all bath pH studied, the deposit composition is strongly dependent on the concentration of thiourea in the bath. At <10–2 M thiourea, copper films are deposited on all substrates and bath pH studies. At ≥10–2 M, the deposited layers are copper sulfides. At pH 5 and pH 9, the deposit is composed of CuS for all functionalized SAMs studied, while at pH 12, the deposit is Cu2S. We propose that the dominant role of thiourea changes with its concentration in the bath, leading to the observed strong dependence of the deposit composition on thiourea concentration. At low thiourea concentrations, it acts as a complexing and reducing agent, while at high concentrations (>10–2 M), the dominant reaction is thiourea hydrolysis, leading to the formation of copper sulfides. Finally, we demonstrate a simple method to deposit layered Cu/CuxS and CuS nanowires by manipulating the thiourea concentration in the bath.

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来源期刊
The Journal of Physical Chemistry C
The Journal of Physical Chemistry C 化学-材料科学:综合
CiteScore
6.50
自引率
8.10%
发文量
2047
审稿时长
1.8 months
期刊介绍: The Journal of Physical Chemistry A/B/C is devoted to reporting new and original experimental and theoretical basic research of interest to physical chemists, biophysical chemists, and chemical physicists.
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