实用的工业用中子探测方式,可在飞行时间小角散射仪。

IF 2.8 3区 材料科学 Q1 Biochemistry, Genetics and Molecular Biology
Journal of Applied Crystallography Pub Date : 2025-07-02 eCollection Date: 2025-08-01 DOI:10.1107/S1600576725004479
Satoshi Koizumi, Kazuki Mita
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引用次数: 0

摘要

我们报告了iMATERIA仪器的最新进展,即飞行时间小角中子散射(SANS),专门用于制造业和能源行业的测量。可获得多尺度(从最小q min = 0.007 Å-1到最大q = 30 Å-1)、多时域(>0.5 s)和动态核极化的多重对比观测。多角度(或立体)观察薄膜样品可以在传统的SANS和反射率测量之间架起桥梁。为了进行多重分析,我们开发了针对聚合物电解质燃料电池的实时同步SANS和中子射线照相(NR)。在未来,我们计划建立同时三重分析结合SANS, NR和即时γ射线分析。通过1 mm2大小的光束扫描,这种分析可以在NR获得的图像上映射由SANS确定的结构参数和由γ射线快速分析确定的元素组成。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Practical neutron detection modalities for industrial use available at a time-of-flight small-angle scattering instrument.

We report the latest advances of the iMATERIA instrument, namely, time-of-flight small-angle neutron scattering (SANS) specifically for measurements in the manufacturing and energy industries. Observations are available that are multi-scale (from a minimum q min = 0.007 Å-1 to a maximum q = 30 Å-1), multi-time domain (>0.5 s) and multi-contrast by dynamical nuclear polarization. Multi-angle (or stereo) observation of film specimens can bridge between conventional SANS and reflectivity measurements. For multi-analysis, we have developed real-time simultaneous SANS and neutron radiography (NR), targeting polymer electrolyte fuel cells. In the future, we plan to establish simultaneous triple-analysis combining SANS, NR and prompt γ-ray analysis. By scanning with a beam of 1 mm2 in size, such analysis enables the mapping of structural parameters determined by SANS and elemental composition determined by prompt γ-ray analysis on the image obtained by NR.

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来源期刊
CiteScore
10.00
自引率
3.30%
发文量
178
审稿时长
4.7 months
期刊介绍: Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.
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