{"title":"近表面小角中子散射探测薄膜内磁性纳米结构的机会。","authors":"Grace L Causer","doi":"10.1107/S1600576725005503","DOIUrl":null,"url":null,"abstract":"<p><p>Near-surface small-angle neutron scattering (NS-SANS) is a highly versatile, yet under-utilized, technique in condensed matter research. It addresses the shortcomings of transmission SANS to enable the characterization of nano-structures within extremely small sample volumes in the thin-film limit. NS-SANS stands out in its capacity to resolve 1D, 2D or 3D structural, chemical and magnetic correlations beneath the surfaces of thin films with nanometre resolution. By varying the incident angle above the critical angle of reflection, NS-SANS delivers tuneable depth sensitivity across nano-confined volumes, effectively minimizing noise contributions from substrates while surpassing the surface-sensitive capabilities of grazing-incidence SANS. This perspective highlights the future potential of NS-SANS to study condensed matter thin films and heterostructures, with a special focus on nanoscale magnetic phenomena, such as topological skyrmion lattices, superconducting vortex lattices and chiral domain walls, which are of timely interest to the magnetism and quantum materials communities.</p>","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"58 Pt 4","pages":"1455-1461"},"PeriodicalIF":2.8000,"publicationDate":"2025-07-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12321037/pdf/","citationCount":"0","resultStr":"{\"title\":\"Opportunities for near-surface small-angle neutron scattering to probe magnetic nanostructures within thin-film volumes.\",\"authors\":\"Grace L Causer\",\"doi\":\"10.1107/S1600576725005503\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p><p>Near-surface small-angle neutron scattering (NS-SANS) is a highly versatile, yet under-utilized, technique in condensed matter research. It addresses the shortcomings of transmission SANS to enable the characterization of nano-structures within extremely small sample volumes in the thin-film limit. NS-SANS stands out in its capacity to resolve 1D, 2D or 3D structural, chemical and magnetic correlations beneath the surfaces of thin films with nanometre resolution. By varying the incident angle above the critical angle of reflection, NS-SANS delivers tuneable depth sensitivity across nano-confined volumes, effectively minimizing noise contributions from substrates while surpassing the surface-sensitive capabilities of grazing-incidence SANS. This perspective highlights the future potential of NS-SANS to study condensed matter thin films and heterostructures, with a special focus on nanoscale magnetic phenomena, such as topological skyrmion lattices, superconducting vortex lattices and chiral domain walls, which are of timely interest to the magnetism and quantum materials communities.</p>\",\"PeriodicalId\":14950,\"journal\":{\"name\":\"Journal of Applied Crystallography\",\"volume\":\"58 Pt 4\",\"pages\":\"1455-1461\"},\"PeriodicalIF\":2.8000,\"publicationDate\":\"2025-07-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12321037/pdf/\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Applied Crystallography\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://doi.org/10.1107/S1600576725005503\",\"RegionNum\":3,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"2025/8/1 0:00:00\",\"PubModel\":\"eCollection\",\"JCR\":\"Q1\",\"JCRName\":\"Biochemistry, Genetics and Molecular Biology\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Applied Crystallography","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1107/S1600576725005503","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2025/8/1 0:00:00","PubModel":"eCollection","JCR":"Q1","JCRName":"Biochemistry, Genetics and Molecular Biology","Score":null,"Total":0}
Opportunities for near-surface small-angle neutron scattering to probe magnetic nanostructures within thin-film volumes.
Near-surface small-angle neutron scattering (NS-SANS) is a highly versatile, yet under-utilized, technique in condensed matter research. It addresses the shortcomings of transmission SANS to enable the characterization of nano-structures within extremely small sample volumes in the thin-film limit. NS-SANS stands out in its capacity to resolve 1D, 2D or 3D structural, chemical and magnetic correlations beneath the surfaces of thin films with nanometre resolution. By varying the incident angle above the critical angle of reflection, NS-SANS delivers tuneable depth sensitivity across nano-confined volumes, effectively minimizing noise contributions from substrates while surpassing the surface-sensitive capabilities of grazing-incidence SANS. This perspective highlights the future potential of NS-SANS to study condensed matter thin films and heterostructures, with a special focus on nanoscale magnetic phenomena, such as topological skyrmion lattices, superconducting vortex lattices and chiral domain walls, which are of timely interest to the magnetism and quantum materials communities.
期刊介绍:
Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.