Hao Yan , Chuan Lin , Ningning Guo , Zhiyuan Xu , Jiefeng Zang , Anyong Qing
{"title":"复杂环境下多类型受电弓异常检测的三阶段框架","authors":"Hao Yan , Chuan Lin , Ningning Guo , Zhiyuan Xu , Jiefeng Zang , Anyong Qing","doi":"10.1016/j.compeleceng.2025.110612","DOIUrl":null,"url":null,"abstract":"<div><div>A novel three-stage framework is proposed in this paper for detecting pantograph anomalies. This framework is capable of detecting anomalies in multiple types of pantographs and is resilient to complex backgrounds and illumination variations, exhibiting strong robustness. In the first stage, the improved Yolov8 network is utilized to localize the pantograph region, addressing the issue of complex backgrounds during pantograph detection. In the second stage, the Short-Term Dense Concatenate (STDC) network is employed for precise segmentation of the pantograph region. Furthermore, corresponding improvements are made to the network to handle edge blurring caused by illumination variations. In the third stage, binary images of different types of pantographs are transformed into vectors that contain pantograph features. Additionally, Relief-F and random forest algorithms are employed for feature selection and anomaly classification. Ultimately, the proposed framework achieves an average accuracy of 97.04% for various anomaly types in a testing set consisting of images of multiple types of pantographs.</div></div>","PeriodicalId":50630,"journal":{"name":"Computers & Electrical Engineering","volume":"127 ","pages":"Article 110612"},"PeriodicalIF":4.9000,"publicationDate":"2025-08-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A three-stage framework for multi-type pantograph anomaly detection under complex environments\",\"authors\":\"Hao Yan , Chuan Lin , Ningning Guo , Zhiyuan Xu , Jiefeng Zang , Anyong Qing\",\"doi\":\"10.1016/j.compeleceng.2025.110612\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>A novel three-stage framework is proposed in this paper for detecting pantograph anomalies. This framework is capable of detecting anomalies in multiple types of pantographs and is resilient to complex backgrounds and illumination variations, exhibiting strong robustness. In the first stage, the improved Yolov8 network is utilized to localize the pantograph region, addressing the issue of complex backgrounds during pantograph detection. In the second stage, the Short-Term Dense Concatenate (STDC) network is employed for precise segmentation of the pantograph region. Furthermore, corresponding improvements are made to the network to handle edge blurring caused by illumination variations. In the third stage, binary images of different types of pantographs are transformed into vectors that contain pantograph features. Additionally, Relief-F and random forest algorithms are employed for feature selection and anomaly classification. Ultimately, the proposed framework achieves an average accuracy of 97.04% for various anomaly types in a testing set consisting of images of multiple types of pantographs.</div></div>\",\"PeriodicalId\":50630,\"journal\":{\"name\":\"Computers & Electrical Engineering\",\"volume\":\"127 \",\"pages\":\"Article 110612\"},\"PeriodicalIF\":4.9000,\"publicationDate\":\"2025-08-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Computers & Electrical Engineering\",\"FirstCategoryId\":\"94\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0045790625005555\",\"RegionNum\":3,\"RegionCategory\":\"计算机科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Computers & Electrical Engineering","FirstCategoryId":"94","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0045790625005555","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
A three-stage framework for multi-type pantograph anomaly detection under complex environments
A novel three-stage framework is proposed in this paper for detecting pantograph anomalies. This framework is capable of detecting anomalies in multiple types of pantographs and is resilient to complex backgrounds and illumination variations, exhibiting strong robustness. In the first stage, the improved Yolov8 network is utilized to localize the pantograph region, addressing the issue of complex backgrounds during pantograph detection. In the second stage, the Short-Term Dense Concatenate (STDC) network is employed for precise segmentation of the pantograph region. Furthermore, corresponding improvements are made to the network to handle edge blurring caused by illumination variations. In the third stage, binary images of different types of pantographs are transformed into vectors that contain pantograph features. Additionally, Relief-F and random forest algorithms are employed for feature selection and anomaly classification. Ultimately, the proposed framework achieves an average accuracy of 97.04% for various anomaly types in a testing set consisting of images of multiple types of pantographs.
期刊介绍:
The impact of computers has nowhere been more revolutionary than in electrical engineering. The design, analysis, and operation of electrical and electronic systems are now dominated by computers, a transformation that has been motivated by the natural ease of interface between computers and electrical systems, and the promise of spectacular improvements in speed and efficiency.
Published since 1973, Computers & Electrical Engineering provides rapid publication of topical research into the integration of computer technology and computational techniques with electrical and electronic systems. The journal publishes papers featuring novel implementations of computers and computational techniques in areas like signal and image processing, high-performance computing, parallel processing, and communications. Special attention will be paid to papers describing innovative architectures, algorithms, and software tools.