求助PDF
{"title":"雷电电流中ZnO元件电磁场、热和热应力的FDTD模拟","authors":"Tomoya Takagi, Yoshihiro Baba","doi":"10.1002/tee.70008","DOIUrl":null,"url":null,"abstract":"<p>Electromagnetic fields, heats, and von Mises stresses in a 37-mm-thick ZnO element have been computed with the FDTD method. The FDTD-computed von Mises stresses ignore shear stresses, but they agree well with those computed with the FEM that considers shear stresses. The FEM-computed maximum principal stress is almost the same as the FEM-computed von Mises stress for a current with a duration of 24 μs, but there is about a 30% difference between them for a current with a time to half peak of 100 μs. © 2025 Institute of Electrical Engineers of Japan and Wiley Periodicals LLC.</p>","PeriodicalId":13435,"journal":{"name":"IEEJ Transactions on Electrical and Electronic Engineering","volume":"20 9","pages":"1470-1473"},"PeriodicalIF":1.1000,"publicationDate":"2025-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"FDTD Simulation of Electromagnetic Field, Heat, and Thermal Stress in a ZnO Element for Lightning Currents\",\"authors\":\"Tomoya Takagi, Yoshihiro Baba\",\"doi\":\"10.1002/tee.70008\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>Electromagnetic fields, heats, and von Mises stresses in a 37-mm-thick ZnO element have been computed with the FDTD method. The FDTD-computed von Mises stresses ignore shear stresses, but they agree well with those computed with the FEM that considers shear stresses. The FEM-computed maximum principal stress is almost the same as the FEM-computed von Mises stress for a current with a duration of 24 μs, but there is about a 30% difference between them for a current with a time to half peak of 100 μs. © 2025 Institute of Electrical Engineers of Japan and Wiley Periodicals LLC.</p>\",\"PeriodicalId\":13435,\"journal\":{\"name\":\"IEEJ Transactions on Electrical and Electronic Engineering\",\"volume\":\"20 9\",\"pages\":\"1470-1473\"},\"PeriodicalIF\":1.1000,\"publicationDate\":\"2025-03-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEJ Transactions on Electrical and Electronic Engineering\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://onlinelibrary.wiley.com/doi/10.1002/tee.70008\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEJ Transactions on Electrical and Electronic Engineering","FirstCategoryId":"5","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1002/tee.70008","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
引用
批量引用