{"title":"用低能电子显微镜观察扭曲锑烯层的畴形态","authors":"Mariusz Gołębiowski , Piotr Dróżdż , Ryszard Zdyb","doi":"10.1016/j.ultramic.2025.114219","DOIUrl":null,"url":null,"abstract":"<div><div>Using low energy electron microscopy we investigate the origin of the contrast between domains in a heterostructure composed of twisted two-dimensional antimonene layers. The contrast is observed in the bright-field microscopy mode under normal incidence of the electron beam. The heterostructure consists of a single-domain β phase grown on a top of two-domain α phase antimonene on a W(110) surface. We show that the observed contrast is due to the formation of two different moiré superlattices and it directly reflects the two-domain structure of α antimonene. We also demonstrate that the contrast depends on the relative symmetry and crystallography of two moiré patterns.</div></div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":"277 ","pages":"Article 114219"},"PeriodicalIF":2.0000,"publicationDate":"2025-07-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Observation of domain morphology in twisted antimonene layers via moiré superlattice contrast with low energy electron microscopy\",\"authors\":\"Mariusz Gołębiowski , Piotr Dróżdż , Ryszard Zdyb\",\"doi\":\"10.1016/j.ultramic.2025.114219\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>Using low energy electron microscopy we investigate the origin of the contrast between domains in a heterostructure composed of twisted two-dimensional antimonene layers. The contrast is observed in the bright-field microscopy mode under normal incidence of the electron beam. The heterostructure consists of a single-domain β phase grown on a top of two-domain α phase antimonene on a W(110) surface. We show that the observed contrast is due to the formation of two different moiré superlattices and it directly reflects the two-domain structure of α antimonene. We also demonstrate that the contrast depends on the relative symmetry and crystallography of two moiré patterns.</div></div>\",\"PeriodicalId\":23439,\"journal\":{\"name\":\"Ultramicroscopy\",\"volume\":\"277 \",\"pages\":\"Article 114219\"},\"PeriodicalIF\":2.0000,\"publicationDate\":\"2025-07-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Ultramicroscopy\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0304399125001172\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"MICROSCOPY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Ultramicroscopy","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0304399125001172","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MICROSCOPY","Score":null,"Total":0}
Observation of domain morphology in twisted antimonene layers via moiré superlattice contrast with low energy electron microscopy
Using low energy electron microscopy we investigate the origin of the contrast between domains in a heterostructure composed of twisted two-dimensional antimonene layers. The contrast is observed in the bright-field microscopy mode under normal incidence of the electron beam. The heterostructure consists of a single-domain β phase grown on a top of two-domain α phase antimonene on a W(110) surface. We show that the observed contrast is due to the formation of two different moiré superlattices and it directly reflects the two-domain structure of α antimonene. We also demonstrate that the contrast depends on the relative symmetry and crystallography of two moiré patterns.
期刊介绍:
Ultramicroscopy is an established journal that provides a forum for the publication of original research papers, invited reviews and rapid communications. The scope of Ultramicroscopy is to describe advances in instrumentation, methods and theory related to all modes of microscopical imaging, diffraction and spectroscopy in the life and physical sciences.