利用陷阱诱导LTPS-TFT电流波动模型研究AMOLED像素闪烁

IF 3.4 2区 工程技术 Q1 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Haolin Li, Zheng Zhou, Xiaoyan Liu
{"title":"利用陷阱诱导LTPS-TFT电流波动模型研究AMOLED像素闪烁","authors":"Haolin Li,&nbsp;Zheng Zhou,&nbsp;Xiaoyan Liu","doi":"10.1016/j.displa.2025.103155","DOIUrl":null,"url":null,"abstract":"<div><div>First frame drop (FFD), low-frequency flicker and various refresh rate (VRR) flicker of 7T1C active-matrix organic light emitting diode (AMOLED) are simulated in real time. By modeling the time-dependent trap capture/emission behavior, hysteresis and the current fluctuation of low-temperature polysilicon thin film transistors (LTPS-TFTs) are simulated. Then the proposed model is applied to the simulation of 7T1C AMOLED pixel. Three forms of flickers are simulated by the proposed trap-induced current fluctuation model and its dependence on frequency and trap properties are also evaluated. Our work provides a physical insight for the circuit transient analysis and a guideline for AMOLED pixel design regarding the reliability issue.</div></div>","PeriodicalId":50570,"journal":{"name":"Displays","volume":"90 ","pages":"Article 103155"},"PeriodicalIF":3.4000,"publicationDate":"2025-07-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Investigation of the flicker of AMOLED pixel by trap-induced LTPS-TFT current fluctuation model\",\"authors\":\"Haolin Li,&nbsp;Zheng Zhou,&nbsp;Xiaoyan Liu\",\"doi\":\"10.1016/j.displa.2025.103155\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>First frame drop (FFD), low-frequency flicker and various refresh rate (VRR) flicker of 7T1C active-matrix organic light emitting diode (AMOLED) are simulated in real time. By modeling the time-dependent trap capture/emission behavior, hysteresis and the current fluctuation of low-temperature polysilicon thin film transistors (LTPS-TFTs) are simulated. Then the proposed model is applied to the simulation of 7T1C AMOLED pixel. Three forms of flickers are simulated by the proposed trap-induced current fluctuation model and its dependence on frequency and trap properties are also evaluated. Our work provides a physical insight for the circuit transient analysis and a guideline for AMOLED pixel design regarding the reliability issue.</div></div>\",\"PeriodicalId\":50570,\"journal\":{\"name\":\"Displays\",\"volume\":\"90 \",\"pages\":\"Article 103155\"},\"PeriodicalIF\":3.4000,\"publicationDate\":\"2025-07-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Displays\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0141938225001921\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Displays","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0141938225001921","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0

摘要

对7T1C有源矩阵有机发光二极管(AMOLED)的第一帧降(FFD)、低频闪烁和各种刷新率闪烁(VRR)进行了实时仿真。通过对低温多晶硅薄膜晶体管(LTPS-TFTs)的阱捕获/发射行为建模,模拟了低温多晶硅薄膜晶体管(LTPS-TFTs)的滞后和电流波动。然后将该模型应用于7T1C AMOLED像素的仿真。利用提出的陷阱感应电流波动模型模拟了三种形式的闪变,并评估了其对频率和陷阱特性的依赖关系。我们的工作为电路瞬态分析提供了物理见解,并为AMOLED像素设计的可靠性问题提供了指导。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Investigation of the flicker of AMOLED pixel by trap-induced LTPS-TFT current fluctuation model
First frame drop (FFD), low-frequency flicker and various refresh rate (VRR) flicker of 7T1C active-matrix organic light emitting diode (AMOLED) are simulated in real time. By modeling the time-dependent trap capture/emission behavior, hysteresis and the current fluctuation of low-temperature polysilicon thin film transistors (LTPS-TFTs) are simulated. Then the proposed model is applied to the simulation of 7T1C AMOLED pixel. Three forms of flickers are simulated by the proposed trap-induced current fluctuation model and its dependence on frequency and trap properties are also evaluated. Our work provides a physical insight for the circuit transient analysis and a guideline for AMOLED pixel design regarding the reliability issue.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
Displays
Displays 工程技术-工程:电子与电气
CiteScore
4.60
自引率
25.60%
发文量
138
审稿时长
92 days
期刊介绍: Displays is the international journal covering the research and development of display technology, its effective presentation and perception of information, and applications and systems including display-human interface. Technical papers on practical developments in Displays technology provide an effective channel to promote greater understanding and cross-fertilization across the diverse disciplines of the Displays community. Original research papers solving ergonomics issues at the display-human interface advance effective presentation of information. Tutorial papers covering fundamentals intended for display technologies and human factor engineers new to the field will also occasionally featured.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信