{"title":"基于电致发光图像半监督语义分割的光伏缺陷自动检测","authors":"Abhishek Jha , Yogesh Rawat , Shruti Vyas","doi":"10.1016/j.engappai.2025.111790","DOIUrl":null,"url":null,"abstract":"<div><div>Photovoltaic (PV) systems allow us to tap into all abundant solar energy, however they require regular maintenance for high efficiency and to prevent degradation. Traditional manual health check, using Electroluminescence (EL) imaging, is expensive and logistically challenging which makes automated defect detection essential. Current automation approaches require extensive manual expert labeling, which is time-consuming, expensive, and prone to errors. We propose PV-S3 (<strong>P</strong>hoto<strong>v</strong>oltaic-<strong>S</strong>emi-supervised <strong>S</strong>emantic <strong>S</strong>egmentation), a Semi-Supervised Learning approach for semantic segmentation of defects in EL images that reduces reliance on extensive labeling. PV-S3 is an artificial intelligence (AI) model trained using a few labeled images along with numerous unlabeled images. We introduce a novel Semi Cross-Entropy loss function to deal with class imbalance. We evaluate PV-S3 on multiple datasets and demonstrate its effectiveness and adaptability. With merely 20% labeled samples, we achieve an absolute improvement of 9.7% in mean Intersection-over-Union (mIoU), 13.5% in Precision, 29.15% in Recall, and 20.42% in F1-Score over prior state-of-the-art supervised method (which uses 100% labeled samples) on University of Central Florida-Electroluminescence (UCF-EL) dataset (largest dataset available for semantic segmentation of EL images) showing improvement in performance while reducing the annotation costs by 80%. For more details, visit our GitHub repository: <span><span>https://github.com/abj247/PV-S3</span><svg><path></path></svg></span>.</div></div>","PeriodicalId":50523,"journal":{"name":"Engineering Applications of Artificial Intelligence","volume":"160 ","pages":"Article 111790"},"PeriodicalIF":7.5000,"publicationDate":"2025-07-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Advancing automatic photovoltaic defect detection using semi-supervised semantic segmentation of electroluminescence images\",\"authors\":\"Abhishek Jha , Yogesh Rawat , Shruti Vyas\",\"doi\":\"10.1016/j.engappai.2025.111790\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>Photovoltaic (PV) systems allow us to tap into all abundant solar energy, however they require regular maintenance for high efficiency and to prevent degradation. Traditional manual health check, using Electroluminescence (EL) imaging, is expensive and logistically challenging which makes automated defect detection essential. Current automation approaches require extensive manual expert labeling, which is time-consuming, expensive, and prone to errors. We propose PV-S3 (<strong>P</strong>hoto<strong>v</strong>oltaic-<strong>S</strong>emi-supervised <strong>S</strong>emantic <strong>S</strong>egmentation), a Semi-Supervised Learning approach for semantic segmentation of defects in EL images that reduces reliance on extensive labeling. PV-S3 is an artificial intelligence (AI) model trained using a few labeled images along with numerous unlabeled images. We introduce a novel Semi Cross-Entropy loss function to deal with class imbalance. We evaluate PV-S3 on multiple datasets and demonstrate its effectiveness and adaptability. With merely 20% labeled samples, we achieve an absolute improvement of 9.7% in mean Intersection-over-Union (mIoU), 13.5% in Precision, 29.15% in Recall, and 20.42% in F1-Score over prior state-of-the-art supervised method (which uses 100% labeled samples) on University of Central Florida-Electroluminescence (UCF-EL) dataset (largest dataset available for semantic segmentation of EL images) showing improvement in performance while reducing the annotation costs by 80%. For more details, visit our GitHub repository: <span><span>https://github.com/abj247/PV-S3</span><svg><path></path></svg></span>.</div></div>\",\"PeriodicalId\":50523,\"journal\":{\"name\":\"Engineering Applications of Artificial Intelligence\",\"volume\":\"160 \",\"pages\":\"Article 111790\"},\"PeriodicalIF\":7.5000,\"publicationDate\":\"2025-07-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Engineering Applications of Artificial Intelligence\",\"FirstCategoryId\":\"94\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0952197625017920\",\"RegionNum\":2,\"RegionCategory\":\"计算机科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"AUTOMATION & CONTROL SYSTEMS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Engineering Applications of Artificial Intelligence","FirstCategoryId":"94","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0952197625017920","RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"AUTOMATION & CONTROL SYSTEMS","Score":null,"Total":0}
Advancing automatic photovoltaic defect detection using semi-supervised semantic segmentation of electroluminescence images
Photovoltaic (PV) systems allow us to tap into all abundant solar energy, however they require regular maintenance for high efficiency and to prevent degradation. Traditional manual health check, using Electroluminescence (EL) imaging, is expensive and logistically challenging which makes automated defect detection essential. Current automation approaches require extensive manual expert labeling, which is time-consuming, expensive, and prone to errors. We propose PV-S3 (Photovoltaic-Semi-supervised Semantic Segmentation), a Semi-Supervised Learning approach for semantic segmentation of defects in EL images that reduces reliance on extensive labeling. PV-S3 is an artificial intelligence (AI) model trained using a few labeled images along with numerous unlabeled images. We introduce a novel Semi Cross-Entropy loss function to deal with class imbalance. We evaluate PV-S3 on multiple datasets and demonstrate its effectiveness and adaptability. With merely 20% labeled samples, we achieve an absolute improvement of 9.7% in mean Intersection-over-Union (mIoU), 13.5% in Precision, 29.15% in Recall, and 20.42% in F1-Score over prior state-of-the-art supervised method (which uses 100% labeled samples) on University of Central Florida-Electroluminescence (UCF-EL) dataset (largest dataset available for semantic segmentation of EL images) showing improvement in performance while reducing the annotation costs by 80%. For more details, visit our GitHub repository: https://github.com/abj247/PV-S3.
期刊介绍:
Artificial Intelligence (AI) is pivotal in driving the fourth industrial revolution, witnessing remarkable advancements across various machine learning methodologies. AI techniques have become indispensable tools for practicing engineers, enabling them to tackle previously insurmountable challenges. Engineering Applications of Artificial Intelligence serves as a global platform for the swift dissemination of research elucidating the practical application of AI methods across all engineering disciplines. Submitted papers are expected to present novel aspects of AI utilized in real-world engineering applications, validated using publicly available datasets to ensure the replicability of research outcomes. Join us in exploring the transformative potential of AI in engineering.