Tonghao Wang , Pingping Liu , Shaoning Jiang , Shujing Wang , Shuai Wang , Yuming Fu , Futian Chen , Xiaoou Yi , Wentuo Han , Qian Zhan , Farong Wan
{"title":"铍中阈值位移能的实验测量","authors":"Tonghao Wang , Pingping Liu , Shaoning Jiang , Shujing Wang , Shuai Wang , Yuming Fu , Futian Chen , Xiaoou Yi , Wentuo Han , Qian Zhan , Farong Wan","doi":"10.1016/j.scriptamat.2025.116891","DOIUrl":null,"url":null,"abstract":"<div><div>Threshold displacement energy (E<sub>d</sub>) is the most fundamental parameter defining and characterizing the irradiation damage of materials. However, there are no experimental values of the E<sub>d</sub> available for beryllium. The beryllium’s E<sub>d</sub> has been experimentally determined using conventional transmission electron microscopy. The orientation dependence for the onset of electron damage has been analyzed for beryllium when irradiated along 〈0001〉, <01<span><math><mover><mn>1</mn><mo>¯</mo></mover></math></span>0>, <1<span><math><mrow><mover><mn>2</mn><mo>¯</mo></mover><mn>1</mn><mover><mn>3</mn><mo>¯</mo></mover></mrow></math></span>> and <2<span><math><mrow><mover><mn>1</mn><mo>¯</mo></mover><mover><mn>1</mn><mo>¯</mo></mover></mrow></math></span>0>. The values of E<sub>d</sub> along these directions are found to be for beryllium, E<sub>d</sub><0001≥35.0 ± 0.8 eV, E<sub>d</sub><01<span><math><mover><mn>1</mn><mo>¯</mo></mover></math></span>0 ≥ 30.5 ± 0.7 eV, E<sub>d</sub><1<span><math><mrow><mover><mn>2</mn><mo>¯</mo></mover><mn>1</mn><mover><mn>3</mn><mo>¯</mo></mover></mrow></math></span>≥29.0 ± 0.7 eV and E<sub>d</sub><2<span><math><mrow><mover><mn>1</mn><mo>¯</mo></mover><mover><mn>1</mn><mo>¯</mo></mover></mrow></math></span>0 ≥ 27.6 ± 0.8 eV. The orientation dependence of the displacement threshold energy of beryllium has also been discussed.</div></div>","PeriodicalId":423,"journal":{"name":"Scripta Materialia","volume":"268 ","pages":"Article 116891"},"PeriodicalIF":5.6000,"publicationDate":"2025-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Experimental measurement of threshold displacement energy in beryllium\",\"authors\":\"Tonghao Wang , Pingping Liu , Shaoning Jiang , Shujing Wang , Shuai Wang , Yuming Fu , Futian Chen , Xiaoou Yi , Wentuo Han , Qian Zhan , Farong Wan\",\"doi\":\"10.1016/j.scriptamat.2025.116891\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>Threshold displacement energy (E<sub>d</sub>) is the most fundamental parameter defining and characterizing the irradiation damage of materials. However, there are no experimental values of the E<sub>d</sub> available for beryllium. The beryllium’s E<sub>d</sub> has been experimentally determined using conventional transmission electron microscopy. The orientation dependence for the onset of electron damage has been analyzed for beryllium when irradiated along 〈0001〉, <01<span><math><mover><mn>1</mn><mo>¯</mo></mover></math></span>0>, <1<span><math><mrow><mover><mn>2</mn><mo>¯</mo></mover><mn>1</mn><mover><mn>3</mn><mo>¯</mo></mover></mrow></math></span>> and <2<span><math><mrow><mover><mn>1</mn><mo>¯</mo></mover><mover><mn>1</mn><mo>¯</mo></mover></mrow></math></span>0>. The values of E<sub>d</sub> along these directions are found to be for beryllium, E<sub>d</sub><0001≥35.0 ± 0.8 eV, E<sub>d</sub><01<span><math><mover><mn>1</mn><mo>¯</mo></mover></math></span>0 ≥ 30.5 ± 0.7 eV, E<sub>d</sub><1<span><math><mrow><mover><mn>2</mn><mo>¯</mo></mover><mn>1</mn><mover><mn>3</mn><mo>¯</mo></mover></mrow></math></span>≥29.0 ± 0.7 eV and E<sub>d</sub><2<span><math><mrow><mover><mn>1</mn><mo>¯</mo></mover><mover><mn>1</mn><mo>¯</mo></mover></mrow></math></span>0 ≥ 27.6 ± 0.8 eV. The orientation dependence of the displacement threshold energy of beryllium has also been discussed.</div></div>\",\"PeriodicalId\":423,\"journal\":{\"name\":\"Scripta Materialia\",\"volume\":\"268 \",\"pages\":\"Article 116891\"},\"PeriodicalIF\":5.6000,\"publicationDate\":\"2025-07-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Scripta Materialia\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S1359646225003549\",\"RegionNum\":2,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Scripta Materialia","FirstCategoryId":"88","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1359646225003549","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
Experimental measurement of threshold displacement energy in beryllium
Threshold displacement energy (Ed) is the most fundamental parameter defining and characterizing the irradiation damage of materials. However, there are no experimental values of the Ed available for beryllium. The beryllium’s Ed has been experimentally determined using conventional transmission electron microscopy. The orientation dependence for the onset of electron damage has been analyzed for beryllium when irradiated along 〈0001〉, <010>, <1> and <20>. The values of Ed along these directions are found to be for beryllium, Ed<0001≥35.0 ± 0.8 eV, Ed<010 ≥ 30.5 ± 0.7 eV, Ed<1≥29.0 ± 0.7 eV and Ed<20 ≥ 27.6 ± 0.8 eV. The orientation dependence of the displacement threshold energy of beryllium has also been discussed.
期刊介绍:
Scripta Materialia is a LETTERS journal of Acta Materialia, providing a forum for the rapid publication of short communications on the relationship between the structure and the properties of inorganic materials. The emphasis is on originality rather than incremental research. Short reports on the development of materials with novel or substantially improved properties are also welcomed. Emphasis is on either the functional or mechanical behavior of metals, ceramics and semiconductors at all length scales.