基于改进教学优化特征选择方案的并行DCNN自闭症谱系障碍检测

IF 0.8 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC
Triveni Dhamale;Sheetal Bhandari;Varsha Harpale;Pramod Sakhi;Kiran Napte;Anurag Mahajan
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引用次数: 0

摘要

自闭症谱系障碍(ASD)的神经系统疾病的识别对于改善生活质量和为自闭症患者提供适当的医疗护理至关重要。良好的健康和幸福对自闭症患者来说是必不可少的,就像其他人一样。在过去十年中,许多基于机器学习(ML)和深度学习(DL)的技术和方法在磁共振图像(MRI)的帮助下用于自闭症障碍检测(ASD)。该技术的性能容易受到特征表示差、特征冗余、深度学习框架复杂性和图像视觉质量差的影响。本文提出了一种基于并行深度卷积神经网络(PDCNN)的ASDD。它包括图像增强、特征提取、特征选择、深度特征表示和ASDD。提出了一种改进的双级高斯维纳滤波方案,以最大限度地减少图像中的模糊、对比度和光照不均匀。进一步,利用灰度共生矩阵(GLCM)、局部二值模式(LBP)、定向梯度直方图(HOG)和局部定向模式(LDP)对功能MRI (fMRI)的形状和纹理特征进行提取。然后,利用改进的基于教学的方案来选择突出的特征,以最小化PDCNN的计算复杂性。在ABIDE-I数据集上验证了系统的结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Autism spectrum disorder detection using parallel DCNN with improved teaching learning optimization feature selection scheme
The identification of a neurological disorder known as autism spectrum disorder (ASD) is essential and vital for improving the quality of life and providing appropriate medical care for those with autism. Good health and well-being are essential for individuals with autism, just like anyone else. In the last decade, numerous machine learning (ML) and deep learning (DL) based techniques and methods were used for Autism Disorder Detection (ASD) with the help of magnetic resonance images (MRI). The performance of this technique is susceptible to poor feature representation, redundant features, complexity of DL frameworks, and poor visual quality of the images. This paper presents ASDD based on a parallel Deep Convolution Neural Network (PDCNN). It includes image enhancement, feature extraction, feature selection, deep feature representation, and ASDD. It presents an improved double-stage Gaussian Weiner Filtering scheme to minimize blur, contrast, and uneven illumination in some images. Further, it offers the shape and texture feature extraction of functional MRI (fMRI) with gray level co-occurrence matrix (GLCM), local binary pattern (LBP), and histogram of oriented gradient (HOG), and local directional pattern (LDP). Afterward, an improved teaching-learning-based scheme is utilized to select prominent features to minimize the computational intricacy of the PDCNN. The outcomes of the system are validated on the ABIDE-I dataset.
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来源期刊
SAIEE Africa Research Journal
SAIEE Africa Research Journal ENGINEERING, ELECTRICAL & ELECTRONIC-
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