{"title":"基于因果推理和深度度量学习的少弹SAR目标识别","authors":"Ke Wang;Yuqian Mao;Qi Qiao","doi":"10.1109/ACCESS.2025.3589192","DOIUrl":null,"url":null,"abstract":"Deep learning, with large-scale annotated datasets, has demonstrated remarkable success in synthetic aperture radar automatic target recognition (SAR-ATR). However, the collecting of SAR images is expensive and complex, and manually labeling them requires expert knowledge. To overcome these limitations, we propose a few-shot learning model capable of accurate recognition of novel targets with minimal training samples. Our model innovatively integrates causal inference with mutual centralized learning (MCL) to address few-shot SAR-ATR tasks. First, we establish a causal inference framework to identify and model the dependencies among target characteristics, imaging conditions, and category labels. This framework incorporates a novel causal intervention method based on multi-scale random convolution to eliminate spurious correlations caused by imaging variations, thereby enhancing feature stability. Second, we introduce an advanced MCL module to effectively evaluate feature similarity in few-shot settings. MCL breaks through the unidirectional matching paradigm adopted by conventional metric learning. Through its bidirectional feature interactions and dense feature accessibility mechanisms, MCL achieves more robust feature discrimination in few-shot learning tasks. Comprehensive experiments demonstrate that our model outperforms existing advanced few-shot SAR-ATR methods, achieving superior recognition accuracy while maintaining robustness in data-scarce scenarios.","PeriodicalId":13079,"journal":{"name":"IEEE Access","volume":"13 ","pages":"124988-125002"},"PeriodicalIF":3.4000,"publicationDate":"2025-07-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11080412","citationCount":"0","resultStr":"{\"title\":\"Few-Shot SAR Target Recognition via Causal Inference and Deep Metric Learning\",\"authors\":\"Ke Wang;Yuqian Mao;Qi Qiao\",\"doi\":\"10.1109/ACCESS.2025.3589192\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Deep learning, with large-scale annotated datasets, has demonstrated remarkable success in synthetic aperture radar automatic target recognition (SAR-ATR). However, the collecting of SAR images is expensive and complex, and manually labeling them requires expert knowledge. To overcome these limitations, we propose a few-shot learning model capable of accurate recognition of novel targets with minimal training samples. Our model innovatively integrates causal inference with mutual centralized learning (MCL) to address few-shot SAR-ATR tasks. First, we establish a causal inference framework to identify and model the dependencies among target characteristics, imaging conditions, and category labels. This framework incorporates a novel causal intervention method based on multi-scale random convolution to eliminate spurious correlations caused by imaging variations, thereby enhancing feature stability. Second, we introduce an advanced MCL module to effectively evaluate feature similarity in few-shot settings. MCL breaks through the unidirectional matching paradigm adopted by conventional metric learning. Through its bidirectional feature interactions and dense feature accessibility mechanisms, MCL achieves more robust feature discrimination in few-shot learning tasks. Comprehensive experiments demonstrate that our model outperforms existing advanced few-shot SAR-ATR methods, achieving superior recognition accuracy while maintaining robustness in data-scarce scenarios.\",\"PeriodicalId\":13079,\"journal\":{\"name\":\"IEEE Access\",\"volume\":\"13 \",\"pages\":\"124988-125002\"},\"PeriodicalIF\":3.4000,\"publicationDate\":\"2025-07-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11080412\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Access\",\"FirstCategoryId\":\"94\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/11080412/\",\"RegionNum\":3,\"RegionCategory\":\"计算机科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"COMPUTER SCIENCE, INFORMATION SYSTEMS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Access","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/11080412/","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, INFORMATION SYSTEMS","Score":null,"Total":0}
Few-Shot SAR Target Recognition via Causal Inference and Deep Metric Learning
Deep learning, with large-scale annotated datasets, has demonstrated remarkable success in synthetic aperture radar automatic target recognition (SAR-ATR). However, the collecting of SAR images is expensive and complex, and manually labeling them requires expert knowledge. To overcome these limitations, we propose a few-shot learning model capable of accurate recognition of novel targets with minimal training samples. Our model innovatively integrates causal inference with mutual centralized learning (MCL) to address few-shot SAR-ATR tasks. First, we establish a causal inference framework to identify and model the dependencies among target characteristics, imaging conditions, and category labels. This framework incorporates a novel causal intervention method based on multi-scale random convolution to eliminate spurious correlations caused by imaging variations, thereby enhancing feature stability. Second, we introduce an advanced MCL module to effectively evaluate feature similarity in few-shot settings. MCL breaks through the unidirectional matching paradigm adopted by conventional metric learning. Through its bidirectional feature interactions and dense feature accessibility mechanisms, MCL achieves more robust feature discrimination in few-shot learning tasks. Comprehensive experiments demonstrate that our model outperforms existing advanced few-shot SAR-ATR methods, achieving superior recognition accuracy while maintaining robustness in data-scarce scenarios.
IEEE AccessCOMPUTER SCIENCE, INFORMATION SYSTEMSENGIN-ENGINEERING, ELECTRICAL & ELECTRONIC
CiteScore
9.80
自引率
7.70%
发文量
6673
审稿时长
6 weeks
期刊介绍:
IEEE Access® is a multidisciplinary, open access (OA), applications-oriented, all-electronic archival journal that continuously presents the results of original research or development across all of IEEE''s fields of interest.
IEEE Access will publish articles that are of high interest to readers, original, technically correct, and clearly presented. Supported by author publication charges (APC), its hallmarks are a rapid peer review and publication process with open access to all readers. Unlike IEEE''s traditional Transactions or Journals, reviews are "binary", in that reviewers will either Accept or Reject an article in the form it is submitted in order to achieve rapid turnaround. Especially encouraged are submissions on:
Multidisciplinary topics, or applications-oriented articles and negative results that do not fit within the scope of IEEE''s traditional journals.
Practical articles discussing new experiments or measurement techniques, interesting solutions to engineering.
Development of new or improved fabrication or manufacturing techniques.
Reviews or survey articles of new or evolving fields oriented to assist others in understanding the new area.