{"title":"双面抛光中工件旋转行为的动力学分析","authors":"Urara Satake, Yuta Seguchi, Toshiyuki Enomoto (1)","doi":"10.1016/j.cirp.2025.03.009","DOIUrl":null,"url":null,"abstract":"<div><div>Unique clamping mechanism adopted in double-sided polishing (DSP) enables free rotation of workpieces, which is critical for achieving uniform material removal. However, the DSP process has long faced the issue of non-rotating workpieces, resulting in tapered shapes—an issue particularly relevant to silicon wafer polishing. In this study, a kinetic analysis is conducted to investigate workpiece rotation during DSP and to clarify the mechanism underlying tapering. This analysis identifies key variables governing rotational speed and primary factors contributing to workpiece nonrotation. These findings are validated experimentally, and a practical approach to preventing tapering is proposed.</div></div>","PeriodicalId":55256,"journal":{"name":"Cirp Annals-Manufacturing Technology","volume":"74 1","pages":"Pages 435-439"},"PeriodicalIF":3.2000,"publicationDate":"2025-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Kinetic analysis of workpiece rotation behavior during double-sided polishing\",\"authors\":\"Urara Satake, Yuta Seguchi, Toshiyuki Enomoto (1)\",\"doi\":\"10.1016/j.cirp.2025.03.009\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>Unique clamping mechanism adopted in double-sided polishing (DSP) enables free rotation of workpieces, which is critical for achieving uniform material removal. However, the DSP process has long faced the issue of non-rotating workpieces, resulting in tapered shapes—an issue particularly relevant to silicon wafer polishing. In this study, a kinetic analysis is conducted to investigate workpiece rotation during DSP and to clarify the mechanism underlying tapering. This analysis identifies key variables governing rotational speed and primary factors contributing to workpiece nonrotation. These findings are validated experimentally, and a practical approach to preventing tapering is proposed.</div></div>\",\"PeriodicalId\":55256,\"journal\":{\"name\":\"Cirp Annals-Manufacturing Technology\",\"volume\":\"74 1\",\"pages\":\"Pages 435-439\"},\"PeriodicalIF\":3.2000,\"publicationDate\":\"2025-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Cirp Annals-Manufacturing Technology\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0007850625000101\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, INDUSTRIAL\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Cirp Annals-Manufacturing Technology","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0007850625000101","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, INDUSTRIAL","Score":null,"Total":0}
Kinetic analysis of workpiece rotation behavior during double-sided polishing
Unique clamping mechanism adopted in double-sided polishing (DSP) enables free rotation of workpieces, which is critical for achieving uniform material removal. However, the DSP process has long faced the issue of non-rotating workpieces, resulting in tapered shapes—an issue particularly relevant to silicon wafer polishing. In this study, a kinetic analysis is conducted to investigate workpiece rotation during DSP and to clarify the mechanism underlying tapering. This analysis identifies key variables governing rotational speed and primary factors contributing to workpiece nonrotation. These findings are validated experimentally, and a practical approach to preventing tapering is proposed.
期刊介绍:
CIRP, The International Academy for Production Engineering, was founded in 1951 to promote, by scientific research, the development of all aspects of manufacturing technology covering the optimization, control and management of processes, machines and systems.
This biannual ISI cited journal contains approximately 140 refereed technical and keynote papers. Subject areas covered include:
Assembly, Cutting, Design, Electro-Physical and Chemical Processes, Forming, Abrasive processes, Surfaces, Machines, Production Systems and Organizations, Precision Engineering and Metrology, Life-Cycle Engineering, Microsystems Technology (MST), Nanotechnology.