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{"title":"基于正则化-逻辑回归的高海拔长气隙介质强度智能预测","authors":"Zhibin Qiu, Wenhao Chen, Yu Song, Ting Peng, Chen Liu","doi":"10.1002/tee.70051","DOIUrl":null,"url":null,"abstract":"<p>Air discharge originates from the interaction between electric field (EF) and the meteorological environment, and the dielectric strength of a long air gap is affected by both EF distribution and atmospheric parameters. A regularization-logistic regression (R-LR) model is proposed for the accurate calculation of long air gap discharge voltage at high altitudes. Using 4 meteorological features and 9 EF features as inputs for the R-LR model, the R-LR model was trained using discharge test data from rod-plane air gaps at altitudes of 55–4300 m. The trained model was used to predict the dielectric strength of rod-plane air gaps at an altitude of 5000 m. The prediction results of the R-LR model were compared with those of random forest (RF), support vector classifier (SVC) and <i>k</i>-nearest neighbor (KNN) models. The results showed that the accuracy and generalization of the R-LR model were better than those of the other models. The MAPE of the R-LR model on the test set was 1.32%. The model was validated by using the rod-plane air gap discharge test data under different meteorological environments in a plain area. The predicted discharge voltage values were basically consistent with the test values, further demonstrating the effectiveness and generalizability of the model. This study can offer a reference for predicting the dielectric strength of air gaps under different meteorological environments in high altitude areas. © 2025 Institute of Electrical Engineers of Japan and Wiley Periodicals LLC.</p>","PeriodicalId":13435,"journal":{"name":"IEEJ Transactions on Electrical and Electronic Engineering","volume":"20 8","pages":"1148-1156"},"PeriodicalIF":1.0000,"publicationDate":"2025-05-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Intelligent Prediction of Dielectric Strength for Long Air Gaps at High Altitudes Based on Regularization-Logistic Regression\",\"authors\":\"Zhibin Qiu, Wenhao Chen, Yu Song, Ting Peng, Chen Liu\",\"doi\":\"10.1002/tee.70051\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>Air discharge originates from the interaction between electric field (EF) and the meteorological environment, and the dielectric strength of a long air gap is affected by both EF distribution and atmospheric parameters. A regularization-logistic regression (R-LR) model is proposed for the accurate calculation of long air gap discharge voltage at high altitudes. Using 4 meteorological features and 9 EF features as inputs for the R-LR model, the R-LR model was trained using discharge test data from rod-plane air gaps at altitudes of 55–4300 m. The trained model was used to predict the dielectric strength of rod-plane air gaps at an altitude of 5000 m. The prediction results of the R-LR model were compared with those of random forest (RF), support vector classifier (SVC) and <i>k</i>-nearest neighbor (KNN) models. The results showed that the accuracy and generalization of the R-LR model were better than those of the other models. The MAPE of the R-LR model on the test set was 1.32%. The model was validated by using the rod-plane air gap discharge test data under different meteorological environments in a plain area. The predicted discharge voltage values were basically consistent with the test values, further demonstrating the effectiveness and generalizability of the model. This study can offer a reference for predicting the dielectric strength of air gaps under different meteorological environments in high altitude areas. © 2025 Institute of Electrical Engineers of Japan and Wiley Periodicals LLC.</p>\",\"PeriodicalId\":13435,\"journal\":{\"name\":\"IEEJ Transactions on Electrical and Electronic Engineering\",\"volume\":\"20 8\",\"pages\":\"1148-1156\"},\"PeriodicalIF\":1.0000,\"publicationDate\":\"2025-05-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEJ Transactions on Electrical and Electronic Engineering\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://onlinelibrary.wiley.com/doi/10.1002/tee.70051\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEJ Transactions on Electrical and Electronic Engineering","FirstCategoryId":"5","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1002/tee.70051","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
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