片上100v p-GaN hemt模拟单片半桥电路的动态ron和V TH位移分析

{"title":"片上100v p-GaN hemt模拟单片半桥电路的动态ron和V TH位移分析","authors":"Lorenzo Modica, Nicolò Zagni, Marcello Cioni, Giacomo Cappellini, Maria Eloisa Castagna, Giovanni Giorgino, Ferdinando Iucolano, Alessandro Chini","doi":"10.1109/jestpe.2025.3581742","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":13093,"journal":{"name":"IEEE Journal of Emerging and Selected Topics in Power Electronics","volume":"25 1","pages":""},"PeriodicalIF":4.9000,"publicationDate":"2025-06-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Analysis of Dynamic-Ron and V TH shift in on-wafer 100-V p-GaN HEMTs Emulating Monolithically Integrated Half-Bridge Circuits\",\"authors\":\"Lorenzo Modica, Nicolò Zagni, Marcello Cioni, Giacomo Cappellini, Maria Eloisa Castagna, Giovanni Giorgino, Ferdinando Iucolano, Alessandro Chini\",\"doi\":\"10.1109/jestpe.2025.3581742\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":13093,\"journal\":{\"name\":\"IEEE Journal of Emerging and Selected Topics in Power Electronics\",\"volume\":\"25 1\",\"pages\":\"\"},\"PeriodicalIF\":4.9000,\"publicationDate\":\"2025-06-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Journal of Emerging and Selected Topics in Power Electronics\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1109/jestpe.2025.3581742\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Journal of Emerging and Selected Topics in Power Electronics","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1109/jestpe.2025.3581742","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}