Danijel Cuturic;Jonah V. Weidemann;Steven X. Ding;Einar Kruis;Micha S. Obergfell;Chris Louen
{"title":"基于机器学习的纳米粒子生成过程建模与监测控制理论","authors":"Danijel Cuturic;Jonah V. Weidemann;Steven X. Ding;Einar Kruis;Micha S. Obergfell;Chris Louen","doi":"10.1109/TII.2025.3576870","DOIUrl":null,"url":null,"abstract":"Modeling, monitoring and control of nanoparticle generation processes are of critical importance in various industrial applications due to their impact on product quality and process efficiency. While traditional first-principles modeling is foundational, it often falls short due to incomplete knowledge and inherent simplifications. This article presents a novel approach using control theory informed machine learning to enhance the accuracy and reliability of these models. This innovative method is particularly useful in environments with uncertainties and noise, making it well-suited for complex processes in nanotechnology. The incorporation of control-theoretic preknowledge and the integration of kernel-based methods with neural networks enables the designed framework to address the challenges described above. The approach demonstrates significant improvements in predicting key performance indicators quantifying the relevant product parameters. The simulation results validate the effectiveness of the control theory informed machine learning framework, indicating its potential to be a robust and efficient solution for real-time process control in nanoparticle generation.","PeriodicalId":13301,"journal":{"name":"IEEE Transactions on Industrial Informatics","volume":"21 10","pages":"7455-7465"},"PeriodicalIF":9.9000,"publicationDate":"2025-06-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11045439","citationCount":"0","resultStr":"{\"title\":\"A Control Theory Informed Machine Learning-Based Modeling and Monitoring of Nanoparticle Generation Processes\",\"authors\":\"Danijel Cuturic;Jonah V. Weidemann;Steven X. Ding;Einar Kruis;Micha S. Obergfell;Chris Louen\",\"doi\":\"10.1109/TII.2025.3576870\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Modeling, monitoring and control of nanoparticle generation processes are of critical importance in various industrial applications due to their impact on product quality and process efficiency. While traditional first-principles modeling is foundational, it often falls short due to incomplete knowledge and inherent simplifications. This article presents a novel approach using control theory informed machine learning to enhance the accuracy and reliability of these models. This innovative method is particularly useful in environments with uncertainties and noise, making it well-suited for complex processes in nanotechnology. The incorporation of control-theoretic preknowledge and the integration of kernel-based methods with neural networks enables the designed framework to address the challenges described above. The approach demonstrates significant improvements in predicting key performance indicators quantifying the relevant product parameters. The simulation results validate the effectiveness of the control theory informed machine learning framework, indicating its potential to be a robust and efficient solution for real-time process control in nanoparticle generation.\",\"PeriodicalId\":13301,\"journal\":{\"name\":\"IEEE Transactions on Industrial Informatics\",\"volume\":\"21 10\",\"pages\":\"7455-7465\"},\"PeriodicalIF\":9.9000,\"publicationDate\":\"2025-06-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11045439\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Industrial Informatics\",\"FirstCategoryId\":\"94\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/11045439/\",\"RegionNum\":1,\"RegionCategory\":\"计算机科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"AUTOMATION & CONTROL SYSTEMS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Industrial Informatics","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/11045439/","RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"AUTOMATION & CONTROL SYSTEMS","Score":null,"Total":0}
A Control Theory Informed Machine Learning-Based Modeling and Monitoring of Nanoparticle Generation Processes
Modeling, monitoring and control of nanoparticle generation processes are of critical importance in various industrial applications due to their impact on product quality and process efficiency. While traditional first-principles modeling is foundational, it often falls short due to incomplete knowledge and inherent simplifications. This article presents a novel approach using control theory informed machine learning to enhance the accuracy and reliability of these models. This innovative method is particularly useful in environments with uncertainties and noise, making it well-suited for complex processes in nanotechnology. The incorporation of control-theoretic preknowledge and the integration of kernel-based methods with neural networks enables the designed framework to address the challenges described above. The approach demonstrates significant improvements in predicting key performance indicators quantifying the relevant product parameters. The simulation results validate the effectiveness of the control theory informed machine learning framework, indicating its potential to be a robust and efficient solution for real-time process control in nanoparticle generation.
期刊介绍:
The IEEE Transactions on Industrial Informatics is a multidisciplinary journal dedicated to publishing technical papers that connect theory with practical applications of informatics in industrial settings. It focuses on the utilization of information in intelligent, distributed, and agile industrial automation and control systems. The scope includes topics such as knowledge-based and AI-enhanced automation, intelligent computer control systems, flexible and collaborative manufacturing, industrial informatics in software-defined vehicles and robotics, computer vision, industrial cyber-physical and industrial IoT systems, real-time and networked embedded systems, security in industrial processes, industrial communications, systems interoperability, and human-machine interaction.