{"title":"随机子空间识别的可靠截断参数选择和模型阶数估计","authors":"Khashayar Bayati, Karthikeyan Umapathy, Soosan Beheshti","doi":"10.1016/j.jfranklin.2025.107766","DOIUrl":null,"url":null,"abstract":"<div><div>Stochastic subspace identification (SSID) is a fundamental technique for the analysis and prediction of dynamic systems influenced by stochastic processes. This paper addresses critical challenges in SSID, focusing on two steps of SSID, the estimation of truncation hyperparameters and the model order selection, which are pivotal for accurate and robust system parameter estimation. While the existing approaches for truncation hyperparameter estimation mostly rely on arbitrary choices in practice, a new fully automated approach, denoted as Multivariate Reconstruction Error Modelling (MREM), is introduced that is based on a solid theory of measurement errors. Similarly, the existing order selection approaches utilize different penalty terms. However, in application, the optimum approach is chosen by trial and error, and as the data length increases, the methods seem to perform worse, which alarms the issue of consistency. A new method for model order estimation, called Advanced Mean Square Eigenvalue Error (AMSEE) Minimization, is proposed in this work, which is not only consistent as the data length grows but also shows superiority over these existing methods. Instead of a penalty term, the method focuses on the mean square error of the singular value decomposition (SVD) and provides a method that, unlike existing ones, is robust to noise variation. The combination of MREM and AMSEE collectively denoted as MRSEE, achieves rapid convergence to the true model order, maintaining accuracy even as the data length increases. Simulation results consistently confirm these properties and the superiority of MRSEE over the existing approaches, exhibiting better accuracy and robustness against overfitting and underfitting in varying measurement noise conditions. In experiments with synthesized electroencephalogram (EEG) data, MRSEE reduces estimation and true error rates up to 43.44% and 41.16%, respectively, compared to the state-of-the-art approaches. These results highlight MRSEE’s capability to provide robust and reliable solutions for SSID applications, particularly in scenarios with relatively shorter data lengths and lower signal-to-noise ratio (SNR).</div></div>","PeriodicalId":17283,"journal":{"name":"Journal of The Franklin Institute-engineering and Applied Mathematics","volume":"362 11","pages":"Article 107766"},"PeriodicalIF":4.2000,"publicationDate":"2025-06-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Reliable truncation parameter selection and model order estimation for stochastic subspace identification\",\"authors\":\"Khashayar Bayati, Karthikeyan Umapathy, Soosan Beheshti\",\"doi\":\"10.1016/j.jfranklin.2025.107766\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>Stochastic subspace identification (SSID) is a fundamental technique for the analysis and prediction of dynamic systems influenced by stochastic processes. This paper addresses critical challenges in SSID, focusing on two steps of SSID, the estimation of truncation hyperparameters and the model order selection, which are pivotal for accurate and robust system parameter estimation. While the existing approaches for truncation hyperparameter estimation mostly rely on arbitrary choices in practice, a new fully automated approach, denoted as Multivariate Reconstruction Error Modelling (MREM), is introduced that is based on a solid theory of measurement errors. Similarly, the existing order selection approaches utilize different penalty terms. However, in application, the optimum approach is chosen by trial and error, and as the data length increases, the methods seem to perform worse, which alarms the issue of consistency. A new method for model order estimation, called Advanced Mean Square Eigenvalue Error (AMSEE) Minimization, is proposed in this work, which is not only consistent as the data length grows but also shows superiority over these existing methods. Instead of a penalty term, the method focuses on the mean square error of the singular value decomposition (SVD) and provides a method that, unlike existing ones, is robust to noise variation. The combination of MREM and AMSEE collectively denoted as MRSEE, achieves rapid convergence to the true model order, maintaining accuracy even as the data length increases. Simulation results consistently confirm these properties and the superiority of MRSEE over the existing approaches, exhibiting better accuracy and robustness against overfitting and underfitting in varying measurement noise conditions. In experiments with synthesized electroencephalogram (EEG) data, MRSEE reduces estimation and true error rates up to 43.44% and 41.16%, respectively, compared to the state-of-the-art approaches. These results highlight MRSEE’s capability to provide robust and reliable solutions for SSID applications, particularly in scenarios with relatively shorter data lengths and lower signal-to-noise ratio (SNR).</div></div>\",\"PeriodicalId\":17283,\"journal\":{\"name\":\"Journal of The Franklin Institute-engineering and Applied Mathematics\",\"volume\":\"362 11\",\"pages\":\"Article 107766\"},\"PeriodicalIF\":4.2000,\"publicationDate\":\"2025-06-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of The Franklin Institute-engineering and Applied Mathematics\",\"FirstCategoryId\":\"94\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0016003225002595\",\"RegionNum\":3,\"RegionCategory\":\"计算机科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"AUTOMATION & CONTROL SYSTEMS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of The Franklin Institute-engineering and Applied Mathematics","FirstCategoryId":"94","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0016003225002595","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"AUTOMATION & CONTROL SYSTEMS","Score":null,"Total":0}
Reliable truncation parameter selection and model order estimation for stochastic subspace identification
Stochastic subspace identification (SSID) is a fundamental technique for the analysis and prediction of dynamic systems influenced by stochastic processes. This paper addresses critical challenges in SSID, focusing on two steps of SSID, the estimation of truncation hyperparameters and the model order selection, which are pivotal for accurate and robust system parameter estimation. While the existing approaches for truncation hyperparameter estimation mostly rely on arbitrary choices in practice, a new fully automated approach, denoted as Multivariate Reconstruction Error Modelling (MREM), is introduced that is based on a solid theory of measurement errors. Similarly, the existing order selection approaches utilize different penalty terms. However, in application, the optimum approach is chosen by trial and error, and as the data length increases, the methods seem to perform worse, which alarms the issue of consistency. A new method for model order estimation, called Advanced Mean Square Eigenvalue Error (AMSEE) Minimization, is proposed in this work, which is not only consistent as the data length grows but also shows superiority over these existing methods. Instead of a penalty term, the method focuses on the mean square error of the singular value decomposition (SVD) and provides a method that, unlike existing ones, is robust to noise variation. The combination of MREM and AMSEE collectively denoted as MRSEE, achieves rapid convergence to the true model order, maintaining accuracy even as the data length increases. Simulation results consistently confirm these properties and the superiority of MRSEE over the existing approaches, exhibiting better accuracy and robustness against overfitting and underfitting in varying measurement noise conditions. In experiments with synthesized electroencephalogram (EEG) data, MRSEE reduces estimation and true error rates up to 43.44% and 41.16%, respectively, compared to the state-of-the-art approaches. These results highlight MRSEE’s capability to provide robust and reliable solutions for SSID applications, particularly in scenarios with relatively shorter data lengths and lower signal-to-noise ratio (SNR).
期刊介绍:
The Journal of The Franklin Institute has an established reputation for publishing high-quality papers in the field of engineering and applied mathematics. Its current focus is on control systems, complex networks and dynamic systems, signal processing and communications and their applications. All submitted papers are peer-reviewed. The Journal will publish original research papers and research review papers of substance. Papers and special focus issues are judged upon possible lasting value, which has been and continues to be the strength of the Journal of The Franklin Institute.