Quantitative analysis of optical and dielectric properties of rare earth oxides by terahertz time-domain spectroscopy

The insight into the optical and dielectric properties of rare earth elements is critical for industrial development. A method to quantitatively analyse binary rare earth oxide mixtures is proposed based on terahertz time-domain spectroscopy. The terahertz refractive index is extracted by Complex Refractive Index model and the real permittivity of the samples is processed by Landau-Lifshitz-Looyenga model for mixtures of rare earth oxides at different volume ratios, respectively. Application of effective medium theory to raw data from single component samples to eliminate the dielectric influence of dilute PTFE matrices and captured air voids. Efficient extraction of intrinsic refractive index and real permittivity will facilitate quantitative characterization and application of rare earth oxides. This provides a new method to insight the optical properties and dielectric properties of rare earth elements in terahertz frequency band.