配电系统架空开关裸铜接触退化：铜氧化物阻抗，厚度和组成

{"title":"配电系统架空开关裸铜接触退化：铜氧化物阻抗，厚度和组成","authors":"Dallas E. Cormier, Fabien Besnard, Joseph C. Potvin, Jonathan Jordan","doi":"10.1109/tpwrd.2025.3576676","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":13498,"journal":{"name":"IEEE Transactions on Power Delivery","volume":"37 1","pages":""},"PeriodicalIF":3.8000,"publicationDate":"2025-06-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Distribution System Overhead Switch Bare Copper Contact Degradation: Copper Oxide Impedance, Thickness, and Composition\",\"authors\":\"Dallas E. Cormier, Fabien Besnard, Joseph C. Potvin, Jonathan Jordan\",\"doi\":\"10.1109/tpwrd.2025.3576676\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":13498,\"journal\":{\"name\":\"IEEE Transactions on Power Delivery\",\"volume\":\"37 1\",\"pages\":\"\"},\"PeriodicalIF\":3.8000,\"publicationDate\":\"2025-06-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Power Delivery\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1109/tpwrd.2025.3576676\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Power Delivery","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1109/tpwrd.2025.3576676","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}