{"title":"基于频率掩模和解耦最大logit的深度神经网络XAI方法用于故障诊断","authors":"Junfei Du, Yiping Gao, Liang Gao, Xiuyu Li","doi":"10.1016/j.jmsy.2025.06.004","DOIUrl":null,"url":null,"abstract":"<div><div>Recently, various deep neural network (DNN) models have been proposed for fault diagnosis. Owing to the black-box nature of the DNN, Diagnosis results are unexplainable. Therefore, explainable artificial intelligence (XAI) methods are required. However, it is difficult for existing XAI methods to separate fault and irrelevant features because the fault features are instantaneous. To address this issue, a frequency mask and decoupling max-logit-based XAI method (FM-Explainer) is proposed to explain the DNN for fault diagnosis. Because the fault features can be well represented in the frequency domain, the proposed method optimizes a mask on the frequency domain of the input to identify the fault features. In addition, to avoid unreliable explanations caused by out-of-distribution (OoD) data, a regularization is designed based on decoupling max-logit, and the spatial penalty is used, which ensures that no irrelevant features remain in the explanation. Extensive experiments are carried out to verify the effectiveness of the proposed method using five quantitative evaluation metrics: Insertion/Deletion, Sensitivity-N, and Degradation. The results show that the FM-Explainer outperforms existing methods, and explanations by the FM-Explainer are consistent with the fault characteristic frequency. This indicates that the FM-Explainer is effective in precisely identifying fault features.</div></div>","PeriodicalId":16227,"journal":{"name":"Journal of Manufacturing Systems","volume":"82 ","pages":"Pages 98-113"},"PeriodicalIF":12.2000,"publicationDate":"2025-06-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A frequency mask and decoupling max-logit based XAI method to explain DNN for fault diagnosis\",\"authors\":\"Junfei Du, Yiping Gao, Liang Gao, Xiuyu Li\",\"doi\":\"10.1016/j.jmsy.2025.06.004\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>Recently, various deep neural network (DNN) models have been proposed for fault diagnosis. Owing to the black-box nature of the DNN, Diagnosis results are unexplainable. Therefore, explainable artificial intelligence (XAI) methods are required. However, it is difficult for existing XAI methods to separate fault and irrelevant features because the fault features are instantaneous. To address this issue, a frequency mask and decoupling max-logit-based XAI method (FM-Explainer) is proposed to explain the DNN for fault diagnosis. Because the fault features can be well represented in the frequency domain, the proposed method optimizes a mask on the frequency domain of the input to identify the fault features. In addition, to avoid unreliable explanations caused by out-of-distribution (OoD) data, a regularization is designed based on decoupling max-logit, and the spatial penalty is used, which ensures that no irrelevant features remain in the explanation. Extensive experiments are carried out to verify the effectiveness of the proposed method using five quantitative evaluation metrics: Insertion/Deletion, Sensitivity-N, and Degradation. The results show that the FM-Explainer outperforms existing methods, and explanations by the FM-Explainer are consistent with the fault characteristic frequency. This indicates that the FM-Explainer is effective in precisely identifying fault features.</div></div>\",\"PeriodicalId\":16227,\"journal\":{\"name\":\"Journal of Manufacturing Systems\",\"volume\":\"82 \",\"pages\":\"Pages 98-113\"},\"PeriodicalIF\":12.2000,\"publicationDate\":\"2025-06-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Manufacturing Systems\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0278612525001566\",\"RegionNum\":1,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, INDUSTRIAL\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Manufacturing Systems","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0278612525001566","RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, INDUSTRIAL","Score":null,"Total":0}
A frequency mask and decoupling max-logit based XAI method to explain DNN for fault diagnosis
Recently, various deep neural network (DNN) models have been proposed for fault diagnosis. Owing to the black-box nature of the DNN, Diagnosis results are unexplainable. Therefore, explainable artificial intelligence (XAI) methods are required. However, it is difficult for existing XAI methods to separate fault and irrelevant features because the fault features are instantaneous. To address this issue, a frequency mask and decoupling max-logit-based XAI method (FM-Explainer) is proposed to explain the DNN for fault diagnosis. Because the fault features can be well represented in the frequency domain, the proposed method optimizes a mask on the frequency domain of the input to identify the fault features. In addition, to avoid unreliable explanations caused by out-of-distribution (OoD) data, a regularization is designed based on decoupling max-logit, and the spatial penalty is used, which ensures that no irrelevant features remain in the explanation. Extensive experiments are carried out to verify the effectiveness of the proposed method using five quantitative evaluation metrics: Insertion/Deletion, Sensitivity-N, and Degradation. The results show that the FM-Explainer outperforms existing methods, and explanations by the FM-Explainer are consistent with the fault characteristic frequency. This indicates that the FM-Explainer is effective in precisely identifying fault features.
期刊介绍:
The Journal of Manufacturing Systems is dedicated to showcasing cutting-edge fundamental and applied research in manufacturing at the systems level. Encompassing products, equipment, people, information, control, and support functions, manufacturing systems play a pivotal role in the economical and competitive development, production, delivery, and total lifecycle of products, meeting market and societal needs.
With a commitment to publishing archival scholarly literature, the journal strives to advance the state of the art in manufacturing systems and foster innovation in crafting efficient, robust, and sustainable manufacturing systems. The focus extends from equipment-level considerations to the broader scope of the extended enterprise. The Journal welcomes research addressing challenges across various scales, including nano, micro, and macro-scale manufacturing, and spanning diverse sectors such as aerospace, automotive, energy, and medical device manufacturing.